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Research Output 1997 2019

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Conference contribution
2019

In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures

Gupta, G., Tharnmaiah, S. D., Hueting, R. J. E. & Nanver, L. K., 6 Jun 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 12-17 6 p. 8730920

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Molybdenum oxide
Inversion layers
Palladium
Diodes
Silicon
2018
1 Downloads (Pure)

Figures of merit of avalanche-mode silicon LEDS

Hueting, R. J. E., Dutta, S., Agarwal, V. & Annema, A. J., 8 Oct 2018, Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2018, Skuluza, South Africa. SPIE International, Vol. 11043.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

figure of merit
avalanches
light emitting diodes
CMOS
silicon
2 Downloads (Pure)

Investigation of light-emission and avalanche-current mechanisms in PureB SPAD devices

Nanver, L. K., Krakers, M., Knezevic, T., Karavidas, A., Boturchuk, I., Agarwal, V., Hueting, R. J. E., Dutta, S. & Annema, A. J., 8 Oct 2018, Fifth Conference on Sensors, MEMS and Electro-Optical Systems 2018. SPIE International, Vol. 11043.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

avalanche diodes
avalanches
light emission
defects
photons
1 Citation (Scopus)
30 Downloads (Pure)

Optocoupling in CMOS

Agarwal, V., Dutta, S., Annema, A. J., Hueting, R. J. E., Schmitz, J., Lee, M-J., Charbon, E. & Nauta, B., 2 Dec 2018, 2018 IEEE International Electron Devices Meeting (IEDM). San Francisco, USA: IEEE

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
CMOS
light emitting diodes
avalanches
quantum efficiency
communication
2016
9 Citations (Scopus)
43 Downloads (Pure)

An integrated optical link in 140 nm SOI technology

Dutta, S., Hueting, R. J. E., Agarwal, V. V. & Annema, A. J., 5 Jun 2016, Conference on Lasers and Electro-Optics, CLEO: Science and Innovations 2016. Washington: Optical Society of America, p. JW2A.132 (Proceedings Conference on Lasers and Electro-Optics).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Citation (Scopus)

Interface trap density estimation in FinFETs from the subthreshold current

Schmitz, J., Kaleli, B., Kuipers, P., van den Berg, N., Smits, S. M. & Hueting, R. J. E., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). USA: IEEE, p. 164-167 4 p. (Proceedings Conference ICMTS).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

traps
transconductance
wafers
electric potential
temperature
2 Citations (Scopus)
76 Downloads (Pure)

Random telegraph signal phenomena in avalanche mode diodes: application to SPADs

Agarwal, V. V., Annema, A. J., Dutta, S., Hueting, R. J. E., Nanver, L. K. & Nauta, B., 14 Sep 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC). USA: IEEE, p. 264-267 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
avalanche diodes
avalanches
diodes
photons
sustaining
2015
2 Citations (Scopus)

The boost transistor: a field plate controlled LDMOST

Ferrara, A., Schmitz, J., Boksteen, B. K., Hueting, R. J. E., Steeneken, P. G., Heringa, A., Claes, J. & van der Wel, A. P., 10 May 2015, 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD). USA: IEEE, p. 165-168 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Transistors
Electrodes
Electric breakdown
Networks (circuits)
Electric potential
2014
1 Citation (Scopus)

Identifying failure mechanisms in LDMOS transistors by analytical stability analysis

Ferrara, A., Steeneken, P. G., Boksteen, B. K., Heringa, A., Scholten, A. J., Schmitz, J. & Hueting, R. J. E., 22 Sep 2014, Proceedings of the 44th European Solid State Device Research Conference, ESSDERC 2014. USA: IEEE Circuits & Systems Society, p. 321-324 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

10 Citations (Scopus)

Silicon LEDs in FinFET technology

Piccolo, G., Kuindersma, P. I., Ragnarsson, L-A., Hueting, R. J. E., Collaert, N. & Schmitz, J., 26 Sep 2014, Proceeding ofthe 44th European Solid State Device Research Conference (ESSDERC). USA: IEEE Circuits & Systems Society, p. 274-277 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2013
4 Citations (Scopus)

Comparison of electrical techniques for temperature evaluation in power MOS transistors

Ferrara, A., Steeneken, P. G., Reimann, K., Heringa, A., Yan, L., Boksteen, B. K., Swanenberg, M., Koops, G. E. J., Scholten, A. J., Surdeanu, R., Schmitz, J. & Hueting, R. J. E., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures (ICMTS 2013). USA: IEEE, p. 115-120 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

MOSFET devices
Temperature
Diodes
Chucks
Gates (transistor)
9 Citations (Scopus)
60 Downloads (Pure)

Design optimization of field-plate assisted RESURF devices

Boksteen, B. K., Ferrara, A., Heringa, A., Steeneken, P. G., Koops, G. E. J. & Hueting, R. J. E., 26 May 2013, 25th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2013. USA: IEEE Circuits & Systems Society, p. 237-240 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File

Role of junction depth in light emission from silicon p-i-n LEDs

Piccolo, G., Sammak, A., Hueting, R. J. E., Schmitz, J. & Nanver, L. K., 16 Sep 2013, Proceeding of European Solid State Device Research Conference (ESSDERC 2013). USA: IEEE, p. 119-122 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

The safe operating volume as a general measure for the operating limits of LDMOS transistors

Ferrara, A., Steeneken, P. G., Heringa, A., Boksteen, B. K., Swanenberg, M., Scholten, A. J., van Dijk, L., Schmitz, J. & Hueting, R. J. E., 9 Dec 2013, International Electron Devices Meeting (IEDM 2013). USA: IEEE Electron Devices Society, p. 6.7.1-6.7.4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2012
5 Citations (Scopus)

Active strain modulation in field effect devices

van Hemert, T. & Hueting, R. J. E., 17 Sep 2012, Solid-State Device Research Conference (ESSDERC), 2012 Proceedings of the European. USA: IEEE Solid-State Circuits Society, p. 125-128 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Extraction of the Electric Field in Field Plate Assisted RESURF Devices

Boksteen, B. K., Dhar, S., Heringa, A., Koops, G. E. J. & Hueting, R. J. E., 3 Jun 2012, Proceedings of 24th International Symposium on Power Semiconductor Devices and ICs (ISPSD 2012). USA: IEEE Electron Devices Society, p. 145-148 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

On the degradation of field-plate assisted RESURF power devices

Boksteen, B. K., Dhar, S., Ferrara, A., Heringa, A., Hueting, R. J. E., Koops, G. E. J., Salm, C. & Schmitz, J., 10 Dec 2012, IEEE International Electron Devices Meeting, IEDM 2012. San Francisco - USA: IEEE International Electron Device Meeting, p. 311-314 4 p. (Technical Digest).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2011
1 Citation (Scopus)

Experimental investigation of dual wave optimized reflector stacks in solidly mounted resonators

Jose, S. & Hueting, R. J. E., 2011, Proceedings IEEE International Ultrasonics Symposium, IUS 2011. Los Alamitos, CA, USA: IEEE, p. -1234

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

reflectors
resonators
gratings (spectra)
phase error
longitudinal waves
8 Citations (Scopus)

Exploring Capacitance-Voltage measurements to find the Piezoelectric Coefficient of Aluminum Nitride

van Hemert, T., Sakriotis, D., Hueting, R. J. E. & Schmitz, J., 4 Apr 2011, 24th International Conference on Microelectronic Test Structures, ICMTS 2011. USA: IEEE Electron Devices Society, p. 69-73 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Extracting the Conduction Band Offset in Strained FinFETs from Subthreshold-Current Measurements

van Hemert, T., Kaleli, B., Hueting, R. J. E., Esseni, D., van Dal, M. J. H. & Schmitz, J., 12 Sep 2011, Proceedings of the 41st European Solid-State Device Research Conference (Essderc 2011). USA: IEEE Solid-State Circuits Society, p. 275-278 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
1 Downloads (Pure)

Increased light emission by geometrical changes in Si LEDs

Puliyankot Palackavalapil, V., Piccolo, G., Hueting, R. J. E., Heringa, A., Kovalgin, A. Y. & Schmitz, J., 14 Sep 2011, Proceedings of the 8th International Conference on Group IV Photonics (GFP). USA: IEEE Photonics Society, p. 287-289 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Light emission enhancement by geometrical scaling of carrier injectors in Si-based LEDs

Piccolo, G., Puliyankot Palackavalapil, V., Kovalgin, A. Y., Hueting, R. J. E., Heringa, A. & Schmitz, J., 12 Sep 2011, 2011 Proceedings of the 41st European Solid-State Device Research Conference (Essderc). USA: IEEE Solid-State Circuits Society, p. 175-178 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

On the rule of thumb for flipping the dispersion relation in BAW devices

Jose, S., Hueting, R. J. E. & Jansman, A., 18 Oct 2011, Unknown. Los Alamitos, CA, USA: IEEE, p. -1712

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

acoustic impedance
aluminum nitrides
resonators
mirrors
silicon dioxide
2010

Acoustic dispersion of solidly mounted resonators with an optimized reflector stack for dual wave reflection

Jose, S., Hueting, R. J. E. & Jansman, A., 11 Oct 2010, Proceedings of the IEEE International Ultrasonics Symposium, IUS 2010. USA: IEEE Ultrasonics, Ferroelectrics & Frequency Control Society, p. 91-94 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)
32 Downloads (Pure)

A new model for the backscatter coefficient in nanoscale MOSFETs

van der Steen, J. P. J., Palestri, P., Esseni, D. & Hueting, R. J. E., 13 Sep 2010, Proceedings of the 40th European Solid-State Device Research, Essderc 2010. USA: IEEE Solid-State Circuits Society, p. 234-237 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
108 Downloads (Pure)

An Initial study on The Reliability of Power Semiconductor Devices

Boksteen, B. K., Hueting, R. J. E., Salm, C. & Schmitz, J., 18 Nov 2010, Proceedings of STW.ICT Conference 2010. Utrecht: Technology Foundation (STW), p. 68-72 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
139 Downloads (Pure)

Electron Beam Lithography of HSQ and PMMA Resists and Importance of their Properties to Link the Nano World to the Micro World

Kaleli, B., Aarnink, A. A. I., Smits, S. M., Hueting, R. J. E., Wolters, R. A. M. & Schmitz, J., 18 Nov 2010, Proceeding of STW.ICT Conference 2010. Utrecht: Technology Foundation (STW), p. 105-108 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
7 Citations (Scopus)
67 Downloads (Pure)

On the modelling and optimisation of a novel Schottky based silicon rectifier

van Hemert, T., Hueting, R. J. E., Rajasekharan, B., Salm, C. & Schmitz, J., 13 Sep 2010, Proceedings of the 40th European Solid-State Device Research, Essderc 2010. USA: IEEE Solid-State Circuits Society, p. 460-463 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
2009
6 Citations (Scopus)
105 Downloads (Pure)

A design procedure for an acoustic mirror providing dual reflection of longitudinal and shear waves in Solidly Mounted BAW Resonators (SMRs)

Jose, S., Jansman, A. & Hueting, R. J. E., Sep 2009, Proceedings of the IEEE International Ultrasonics Symposium (IUS) 2009. Piscataway: IEEE, p. 2111-2114 4 p. 10.1109/ULTSYM.2009.5442065

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File

An initial modelling and simulation study on the 1D Si-Based LED

Puliyankot Palackavalapil, V., Hueting, R. J. E. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: Technology Foundation (STW), p. 170-173 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Metal contacts to lowly doped Si and ultra thin SOI

Rajasekharan, B., Salm, C., Hueting, R. J. E., Wolters, R. A. M. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: Technology Foundation (STW), p. 103-104 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Solidly Mounted Resonator with Optimized Acoustic Reflector

Jose, S., Jansman, A. & Hueting, R. J. E., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: Technology Foundation (STW), p. 159-162 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

2008

Charge plasma diode - a novel device concept

Rajasekharan, B., Hueting, R. J. E., Salm, C., Hoang, T. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: Technology Foundation (STW), p. 576-579 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)
46 Downloads (Pure)

Dimensional scaling effects on transport properties of ultrathin body p-i-n diodes

Rajasekharan, B., Salm, C., Hueting, R. J. E., Hoang, T. & Schmitz, J., 13 Mar 2008, Proceedings of the 9th Conference on ULtimate Integration on Silicon. Piscataway: IEEE Computer Society Press, p. 195-198 4 p. 10.1109/ULIS.2008.4527172. (Electron Device Society; no. DTR08-9).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File

Energy band offset extraction - a comparative study

van der Steen, J. P. J., Hueting, R. J. E. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: Technology Foundation (STW), p. 592-595 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Extracting energy band offsets on Thin Silicon-On-Insulator MOSFETs

van der Steen, J. P. J., Hueting, R. J. E. & Schmitz, J., 15 Sep 2008, Proceedings of the 38th European Solid-State Device Research Conference. Edinburgh, Schotland: IOP Institute of Physics, p. 242-245 4 p. 10.1109/ESSDERC.2008.4681743

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

16 Citations (Scopus)
309 Downloads (Pure)

Identifying dielectric and resistive electrode losses in high-density capacitors at radio frequencies

Tiggelman, M. P. J., Reimann, K., Liu, J., Klee, M., Keur, W., Mauczock, R., Schmitz, J. & Hueting, R. J. E., 24 Mar 2008, Proceedings of the 21st ICMTS 2008 IEEE Conference on Microelectronic Test Structures. Piscataway: IEEE Computer Society Press, p. 190-195 6 p. 10.1109/ICMTS.2008.4509337

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
282 Downloads (Pure)

Modelling of bulk acoustic wave resonators for microwave filters

Jose, S., Hueting, R. J. E. & Jansman, A., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: Technology Foundation (STW), p. 558-561 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File

On the switching speed of SOI LEDs

Schmitz, J., de Vries, R., Salm, C., Hoang, T., Hueting, R. J. E. & Holleman, J., 23 Jan 2008, Proceedings of the Fourth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. Cork, Ireland: Tyndall National Institute, p. 101-102 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

The trade-off between tuning ratio and quality factor of BaxSr1-xTiO3 MIM capacitors on alumina substrates

Tiggelman, M. P. J., Reimann, K., Liu, J., Klee, M., Mauczok, R., Keur, W., Schmitz, J. & Hueting, R. J. E., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: Technology Foundation (STW), p. 506-508 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2007

Band Offset Measurements on Ultra-Thin (100) SOI MOSFETs

van der Steen, J. P. J., Hueting, R. J. E., Smit, G. D. J., Hoang, T., Holleman, J. & Schmitz, J., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: Technology Foundation (STW), p. 460-464 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Dimensional scaling effects on transport properties of p-i-n diodes

Rajasekharan, B., Salm, C., Hueting, R. J. E., Hoang, T., van der Wiel, W. G. & Schmitz, J., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: Technology Foundation (STW), p. 457-459 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Separation of intrinsic dielectric and resistive electrode losses in ferroelectric capacitors at radio frequencies

Tiggelman, M. P. J., Reimann, K., Klee, M., Schmitz, J., Hueting, R. J. E., Liu, J., Furukawa, Y., Mauczok, R. & Keur, W., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: Technology Foundation (STW), p. 465-467 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2006
201 Downloads (Pure)

Electrical characterization of thin film ferroelectric capacitors

Tiggelman, M. P. J., Reimann, K., Klee, M., Beelen, D., Keur, W., Schmitz, J. & Hueting, R. J. E., 23 Nov 2006, Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006. Utrecht, The Netherlands: Technology Foundation (STW), p. 439-443 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
1997
4 Citations (Scopus)

Inverse SiGe heterojunction bipolar transistor

Van Den Oever, L. C. M., Nanver, L. K., Visser, C. C. G., Scholtes, T. L. M., Hueting, R. J. E. & Slotboom, J., 1 Jan 1997, European Solid-State Device Research Conference. Grunbacher, H. (ed.). IEEE Computer Society Press, p. 540-543 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Heterojunction bipolar transistors
Capacitance
Processing
Costs