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Research Output 1997 2019

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Paper
2003
5 Citations (Scopus)
43 Downloads (Pure)

An improved method for determining the inversion layer mobility of electrons in trench MOSFETs

van den Heuvel, M. G. L., Hueting, R. J. E., Hijzen, E. A. & in ‘t Zandt, M. A. A., 2003, p. 173-176.

Research output: Contribution to conferencePaperAcademic

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