Research output per year
Research output per year
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Dive into the research topics where Robbert W.E. van de Kruijs is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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Chemical Interaction of Hydrogen Radicals (H*) with Transition Metal Nitrides
Rehman, A., Kruijs, R. W. E. V. D., Beld, W. T. E. V. D., Sturm, J. M. & Ackermann, M., 14 Sept 2023, In: The Journal of physical chemistry C. 127, 36, p. 17770-17780 11 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile1 Citation (Scopus)14 Downloads (Pure) -
Corrigendum to “In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers” [Appl. Surf. Sci. 258(1) (2011) 7–12]
Chen, J., Louis, E., Harmsen, R., Tsarfati, T., Wormeester, H., van Kampen, M., van Schaik, W., van de Kruijs, R. & Bijkerk, F., 1 May 2023, In: Applied surface science. 618, 1 p., 155765.Research output: Contribution to journal › Comment/Letter to the editor › Academic › peer-review
Open AccessFile2 Downloads (Pure) -
Determination of optical constants of thin films in the EUV
Ciesielski, R., Saadeh, Q., Philipsen, V., Opsomer, K., Soulié, J. P., Wu, M., Naujok, P., van de Kruijs, R. W. E., Detavernier, C., Kolbe, M., Scholze, F. & Soltwisch, V., 8 Mar 2022, In: Applied Optics. 61, 8, p. 2060-2078 19 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile17 Citations (Scopus)4 Downloads (Pure) -
Fracture Toughness of Free-Standing ZrSiₓ Thin Films Measured Using Crack-on-a-Chip Method
Shafikov, A., van de Kruijs, R. W. E., Benschop, J. P. H., van den Beld, W., Houweling, S. & Bijkerk, F., 1 Feb 2022, In: Journal of microelectromechanical systems. 31, 1, p. 63-73 11 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile70 Downloads (Pure) -
LEIS analysis of thin Cu films on Ru: an unexpected result on sputter intermixing
Sturm, J. M., van de Kruijs, R. W. E., Phadke, P. & Ackermann, M., 19 May 2022, (Unpublished).Research output: Contribution to conference › Poster › Academic
Datasets
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EUV optical constants data set
Ciesielski, R. (Creator), Saadeh, Q. (Creator), Philipsen, V. (Creator), Opsomer, K. (Creator), Soulié, J. (Creator), Wu, M. (Creator), Naujok, P. (Creator), van de Kruijs, R. W. E. (Creator), Detavernier, C. (Creator), Kolbe, M. (Creator), Scholze, F. (Creator) & Soltwisch, V. (Creator), Zenodo, 28 Oct 2021
DOI: 10.5281/zenodo.5602719, https://zenodo.org/record/5602719
Dataset
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Low Energy Ion Interactions with Transition Metal Films: ballistic and Diffusive Transport Processes
Parikshit Phadke (Speaker), Marko Sturm (Contributor), Robbert W.E. van de Kruijs (Contributor), Fred Bijkerk (Contributor) & Marcel David Ackermann (Contributor)
11 Jul 2022Activity: Talk or presentation › Oral presentation
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Correlated lateral density fluctuations in the Si layers of a W/Si multilayer revealed by GISAXS
Konstantin Nikolaev (Contributor), Sergey N. Yakunin (Contributor), Igor A. Makhotkin (Speaker), Joris de la Rie (Contributor), Roman Medvedev (Contributor), A.V. Rogachev (Contributor), C.P. Hendrikx (Contributor), M. Gateshki (Contributor), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor), Andrey Yakshin (Contributor) & F. Bijkerk (Contributor)
8 Nov 2018Activity: Talk or presentation › Oral presentation
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Advancing thin film X-ray reflectivity data analysis
Igor A. Makhotkin (Speaker), Sergey N. Yakunin (Contributor), J.F. Woitok (Contributor), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor) & F. Bijkerk (Contributor)
12 Dec 2018Activity: Talk or presentation › Oral presentation
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Stress development of thin films monitored in-situ by cantilever laser deflection and low energy ion scattering
Robbert Wilhelmus Elisabeth van de Kruijs (Speaker), Johan Reinink (Contributor) & F. Bijkerk (Contributor)
11 Dec 2018Activity: Talk or presentation › Oral presentation
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Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses
Igor A. Makhotkin (Speaker), Igor Milov (Contributor), Ryszard Sobierajski (Contributor), Jaromir Chalupský (Contributor), Kai Tiedtke (Contributor), Nikita Medvedev (Contributor), vladimir lipp (Contributor), B. Ziaja (Contributor), Frank Scholze (Contributor), V. Zhakhovsky (Contributor), N. Inogamov (Contributor), Hartmut Enkisch (Contributor), Gosse de Vries (Contributor), Frank Scholze (Contributor), Frank Siewert (Contributor), J.M. Sturm (Contributor), Konstantin Nikolaev (Contributor), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor), Eric Louis (Contributor), Iwanna Jacyna (Contributor), Marek Jurek (Contributor), Dorota Klinger (Contributor), Laurent Nittler (Contributor), Yevgen Syryanyy (Contributor), Libor Juha (Contributor), Věra Hájková (Contributor), Vojtěch Vozda (Contributor), Tomáš Burian (Contributor), Karel Saksl (Contributor), Bart Faatz (Contributor), Barbara Keitel (Contributor), Elke Plönjes (Contributor), Siegfried Schreiber (Contributor), Sven Toleikis (Contributor), R.A. Loch (Contributor), Martin Hermann (Contributor), Sebastian Strobel (Contributor), Han Kwang Nienhuys (Contributor), Rilpho Dunker (Contributor), Grzegorz Gwalt (Contributor), Tobias Mey (Contributor), Mark A. Smithers (Contributor), Hendricus A.G.M. van Wolferen (Contributor), Enrico G. Keim (Contributor) & F. Bijkerk (Contributor)
23 Jan 2018Activity: Talk or presentation › Invited talk