Fingerprint Dive into the research topics where Robbert W.E. van de Kruijs is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Physics & Astronomy
Physics
reflectance
wavelengths
optics
nitrogen ions
ions
roughness
laser beams
General
mirrors
thin films
grazing incidence
retarding
barrier layers
radiation
standing waves
free electron lasers
shot
damage
thermal stability
purity
metals
infrared suppression
absorbers (materials)
bombardment
incidence
absorbers
energy
gratings
passivity
masks
transition metals
metal surfaces
thresholds
Chemistry and Materials
laminates
ruthenium
oxidation
molybdenum
oxygen
Engineering
x rays
lithography
coatings
annealing
ion scattering
interlayers
Bragg reflectors
photolithography
magnetron sputtering
antireflection coatings
sputtering
radiation sources
Aerospace Sciences
photoelectron spectroscopy
Engineering & Materials Science
Multilayers
Boron
Thin films
X rays
Optics
Masks
Nitridation
Extreme ultraviolet lithography
Ellipsometry
Ion bombardment
Photodetectors
Diffusion barriers
Hydrogen
X ray photoelectron spectroscopy
Defects
Ions
Carbon
Nitrogen
Transition metals
Surface roughness
Free electron lasers
Radiation
Wavelength
Metals
Substrates
Ruthenium
Crystalline materials
Vacancies
Temperature
Imaging techniques
Transmission electron microscopy
Annealing
Activation energy
Lithography
X ray absorption spectroscopy
Oxides
Sputtering
Optical materials
Boron nitride
Crystallites
Diffraction
X ray diffraction
Scaling laws
Stress measurement
Radiation damage
Ultraviolet radiation
Film growth
Structural properties
Deuterium
Optical devices
Chemical Compounds
Multilayers
Boron
Thin films
X rays
Masks
X ray absorption spectroscopy
Nitridation
Metals
Extreme ultraviolet lithography
Optics
Defects
Transition metals
Hydrogen
Ions
Vacancies
Crystals
Nitrogen
Annealing
Transmission electron microscopy
Optical materials
Boron Compounds
Crystallites
Deuterium
Scaling laws
X ray photoelectron spectroscopy
Film growth
Crystalline materials
Ion bombardment
Scattering
X ray absorption
X ray scattering
Wavelength
Imaging techniques
X ray diffraction
Activation energy
Oxygen
Superconducting materials
Diffraction
Sputtering
Optical constants
Desorption
Diffusion barriers
Lithography