Roman Medvedev

  • 1 Citations
  • 1 h-Index
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  • 25 Similar Profiles
grazing incidence Physics & Astronomy
X ray scattering Engineering & Materials Science
polishing Physics & Astronomy
laminates Physics & Astronomy
Multilayers Engineering & Materials Science
x rays Physics & Astronomy
scattering Physics & Astronomy
Transmission electron microscopy Engineering & Materials Science

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Research Output 2017 2019

  • 1 Citations
  • 1 h-Index
  • 2 Article
  • 1 Poster
1 Citation (Scopus)
20 Downloads (Pure)

Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayers

Nikolaev, K. V., Yakunin, S. N., Makhotkin, I. A., de la Rie, J., Medvedev, R. V., Rogachev, A. V., Trunckin, I. N., Vasiliev, A. L., Hendrikx, C. P., Gateshki, M., van de Kruijs, R. W. E. & Bijkerk, F., Mar 2019, In : Acta Crystallographica Section A: Foundations and Advances. 75, p. 342-351 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
X ray scattering
grazing incidence
Scanning Transmission Electron Microscopy

Low-energy ion polishing of Si in W/Si soft X-ray multilayer structures

Medvedev, R. V., Nikolaev, K. V., Zameshin, A. A., Ijpes, D., Makhotkin, I. A., Yakunin, S. N., Yakshin, A. E. & Bijkerk, F., 28 Jul 2019, In : Journal of applied physics. 126, 4, 045302.

Research output: Contribution to journalArticleAcademicpeer-review


Small period multilayer structures for X-ray spectroscopic applications

Medvedev, R., Yakshin, A. & Bijkerk, F., 17 Jan 2017.

Research output: Contribution to conferencePoster

Activities 2018 2019

  • 2 Oral presentation

Structural analysis of ion polished W/Si soft X-ray multilayer reflectors

Roman Medvedev (Contributor), Konstantin Nikolaev (Contributor), Andrey Zameshin (Contributor), Dennis IJpes (Contributor), Igor A. Makhotkin (Contributor), Sergey N. Yakunin (Contributor), Andrey Yakshin (Speaker), Fred Bijkerk (Contributor)
21 Oct 201923 Oct 2019

Activity: Talk or presentationOral presentation

Correlated lateral density fluctuations in the Si layers of a W/Si multilayer revealed by GISAXS

Konstantin Nikolaev (Contributor), Sergey N. Yakunin (Contributor), Igor A. Makhotkin (Speaker), Joris de la Rie (Contributor), Roman Medvedev (Contributor), A.V. Rogachev (Contributor), C.P. Hendrikx (Contributor), M. Gateshki (Contributor), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor), Andrey Yakshin (Contributor), F. Bijkerk (Contributor)
8 Nov 2018

Activity: Talk or presentationOral presentation