Bunda, S.,
Spreeuwers, L. &
Zeinstra, C.,
16 Sept 2022,
2022 International Conference of the Biometrics Special Interest Group (BIOSIG). Bromme, A., Damer, N., Gomez-Barrero, M., Raja, K., Rathgeb, C., Sequeira, A. F., Todisco, M. & Uhl, A. (eds.). Piscataway, NJ:
IEEE,
p. 1-5 5 p. 9897025. (International Conference of the Biometrics Special Interest Group (BIOSIG); vol. 2022).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review