Bunda, S., Spreeuwers, L. & Zeinstra, C., 16 Sep 2022, 2022 International Conference of the Biometrics Special Interest Group (BIOSIG). Piscataway, NJ: IEEE, p. 1-55 p. 9897025. (International Conference of the Biometrics Special Interest Group (BIOSIG); vol. 2022).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review