Research Output per year
Research Output
2019
Fast Magnetic Emission Tests for Continuous Measurements Around an Equipment Under Test
Hartman, T., Moonen, N., Ten Have, B. & Leferink, F., 8 Aug 2019, 2019 ESA Workshop on Aerospace EMC (Aerospace EMC). IEEE, 8788950Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Flexible Low Profile Frequency Selective Surface for X-Band Shielding Applications
Yong Wai Yan, W. Y., Hartman, T. & Alayon Glazunov, A., 7 Nov 2019, 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC). USA: IEEE, p. 435-438 4 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open Access
File
Inclination of Fast Changing Currents Effect the Readings of Static Energy Meters
ten Have, B., Hartman, T., Moonen, N. & Leferink, F., 17 Oct 2019, 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE . USA: IEEE, p. 208-213 6 p. 8871982Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open Access
File
Misreadings of Static Energy Meters due to Conducted EMI caused by fast Changing Current
ten Have, B., Hartman, T., Moonen, N. & Leferink, F., 7 Nov 2019, 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC). USA: IEEE, p. 445-448 4 p. 8893903Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open Access
File
On-site Waveform Characterization at Static Meters Loaded with Electrical Vehicle Chargers
Hartman, T., Pous, M., Azpurua, M., Silva, F. & Leferink, F., 17 Oct 2019, 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE. USA: IEEE, p. 191-196 6 p. 8871469Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open Access
File
Two Sided Earthing Versus one Sided Earthing for Ethernet Cables
Hartman, T. H. F., Keyer, C. H. A., van der Ven, J-K. & Wang, W., 17 Oct 2019, 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE . IEEE Electromagnetic Compatibility Society, p. 619-624 6 p. 19065899Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Why Frequency Domain Tests Like IEC 61000-4-19 Are Not Valid: a Call for Time Domain Testing
ten Have, B., Hartman, T., Moonen, N. & Leferink, F., 17 Oct 2019, 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE. USA: IEEE, p. 124-128 5 p. 8872070Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open Access
File
2018
Direct sampling in Multi-channel synchronous TDEMI measurements
Hartman, T. H. F., Moonen, D. J. G. & Leferink, F., 8 Nov 2018, Proceedings of 2018 IEEE 4th Global Electromagnetic Compatibility Conference. USA: IEEE Electromagnetic Compatibility Society, p. 1-5 5 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Evaluation of multichannel synchronous conducted TDEMI measurements for high voltage power electronics
Hartman, T. H. F., Moonen, D. J. G. & Leferink, F., 8 Oct 2018, Proceedings in 2018 International Symposium on Electromagnetic Compatibility. IEEE Electromagnetic Compatibility Society, p. 839-843 5 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
RFI estimation from Non-GSO satellites based on two line element assisted equivalent power flux density calculations
Hartman, T. H. F., Moonen, D. J. G. & Leferink, F., 8 Oct 2018, 2018 International Symposium on Electromagnetic Compatibility. IEEE Electromagnetic Compatibility Society, p. 17-21 5 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review