Dive into the research topics where Tijmen Smit is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
Smit, T. T., Forlin, B. E., Chen, K.-H., Souvatzoglou, I., Psarakis, M. & Ottavi, M., 20 Nov 2024, 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).IEEE, 6 p. 10753564
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review