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Fingerprint Dive into the research topics where Xingyu Liu is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 60 Similar Profiles
Boron Engineering & Materials Science
Diodes Engineering & Materials Science
Silicon Engineering & Materials Science
Ammonium hydroxide Engineering & Materials Science
Turnaround time Engineering & Materials Science
Electron injection Engineering & Materials Science
Micromachining Engineering & Materials Science
Metals Engineering & Materials Science

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Research Output 2016 2019

  • 3 Article
  • 2 Conference contribution
2 Citations (Scopus)

Limits on Thinning of Boron Layers With/Without Metal Contacting in PureB Si (Photo)Diodes

Knezevic, T., Liu, X., Hardeveld, E., Suligoj, T. & Nanver, L. K., 1 Jun 2019, In : IEEE electron device letters. 40, 6, p. 858-861 4 p., 8686173.

Research output: Contribution to journalArticleAcademicpeer-review

Electron injection
Boron
Diodes
Metals
Monolayers
3 Citations (Scopus)
5 Downloads (Pure)

Material Reliability of Low-Temperature Boron Deposition for PureB Silicon Photodiode Fabrication

Nanver, L. K., Lyon, K., Liu, X., Italiano, J. & Huffman, J., 26 Jun 2018, In : MRS Advances. 3, 57-58, p. 3397-3402 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

photodiodes
boron
fabrication
silicon
diodes
5 Citations (Scopus)

Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

Nanver, L. K., Liu, X. & Knežević, T., 2018, 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 69-74 6 p. (IEEE International Conference on Microelectronic Test Structures (ICMTS)).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Turnaround time
Diodes
Silicon
Electrons
Substrates
6 Citations (Scopus)

Nanometer-Thin Pure Boron Layers as Mask for Silicon Micromachining

Liu, X., Nanver, L. K. & Scholtes, T. L. M., Dec 2017, In : Journal of microelectromechanical systems. 26, 6, p. 1428-1434

Research output: Contribution to journalArticleAcademicpeer-review

Ammonium hydroxide
Micromachining
Boron
Masks
Etching
1 Citation (Scopus)

Comparing current flows in ultrashallow pn-/Schottky-like diodes with 2-diode test method

Liu, X. & Nanver, L. K., 28 Mar 2016, Microelectronic Test Structures (ICMTS), 2016 International Conference on. New York: IEEE, p. 190-195 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Activities 2018 2018

  • 1 Oral presentation

Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

Lis Karen Nanver (Speaker), Xingyu Liu (Contributor), Tihomir Knežević (Contributor)
20 Mar 2018

Activity: Talk or presentationOral presentation