Yorick A. Birkhölzer

  • Source: Scopus
  • Calculated based on no. of publications stored in Pure and citations from Scopus

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Personal profile

Education/Academic qualification

Master, University of Twente

Award Date: 28 Feb 2018


  • QC Physics
  • Materials
  • Oxides
  • Scanning Probe Microscopy
  • X-Ray Diffraction
  • Pulsed Laser Deposition
  • Thin Films
  • Ferroelectric Materials
  • Epitaxial Films


Dive into the research topics where Yorick A. Birkhölzer is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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