Best Lecture Award, Technology Session, Xth Dutch Polymer Days 2010

    Prize

    Description

    Thermal Scanning Probe Lithography: A Highly Localized Spatially Controlled Approach for Sub 50 nm Thermal Chemical Lithography.
    Awarded date16 Feb 2010
    Degree of recognitionNational
    Granting OrganisationsNational Dutch Graduate School of Polymer Science and Technology

    Awarded at event

    Event titleDutch Polymer Days, DPD 2010
    LocationVeldhoven, Netherlands
    Period15 Feb 2010 → 16 Feb 2010

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