Event title | 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022 |
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Location | Austin, United StatesShow on map |
Period | 19 Oct 2022 → 21 Oct 2022 |
Best Paper Award
- Ottavi, Marco (Recipient), Annink, Edian B. (Recipient), Rauwerda, Gerard K. (Recipient), Hakkennes, Edwin (Recipient), Menicucci, Alessandra (Recipient), Di Mascio, Stefano (Recipient) & Furano, Gianluca (Recipient)
Prize: Other distinction