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Best paper award

  • Veldhuis, Raymond (Recipient)

Prize

Description

Best paper award for the IEEE-TBIOM paper 'On the relation between the ROC and the CMC'.
Degree of recognitionInternational
Granting OrganisationsIEEE Computer Society

Awarded at event

Event titleIEEE International Joint Conference on Biometrics, IJCB 2024
LocationBuffalo, United StatesShow on map
Period15 Sept 202418 Sept 2024

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