Poster Prize Technology Session, Xth Dutch Polymer Days 2010

  • Memesa, M. (Recipient), Schön, Peter Manfred (Recipient), Tranchida, D.D. (Recipient), Phang, In Yee (Recipient), Diaz, J. (Recipient), Schönherr, Holger (Recipient) & Vancso, Gyula J. (Recipient)



AFM and ellipsometry combined for nanoscale imaging
Degree of recognitionNational
Granting OrganisationsNational Dutch Graduate School of Polymer Science and Technology

Awarded at event

Event titleDutch Polymer Days, DPD 2010
LocationVeldhoven, NetherlandsShow on map
Period15 Feb 2010 → 16 Feb 2010