μtrack profiles for investigating side effects of advanced silicon heads for helical scan tape systems

A. Hozoi; J.P.J. Groenland; J.C. Lodder; J.B. Albertini

doi:10.1109/INTMAG.2002.1000652

μtrack profiles for investigating side effects of advanced silicon heads for helical scan tape systems

A. Hozoi, J.P.J. Groenland, J.C. Lodder, J.B. Albertini

Research output: Contribution to conference › Paper

Abstract

Track and μtrack scans are common techniques in hard disk systems for investigating side writing and side reading, and for characterizing the response of MR read heads. These methods are implemented less in tape systems, where the contact recording mode and flexible medium make it difficult to obtain a smooth relative movement between head and medium. Positioning instability generates fluctuations in track profiles (S. Fukuda et al, 2000). We optimized an experimental system, using helical scan type heads and tape wound on a rotary drum, for measuring sub-μm track profiles. Writing and reading operations are performed with the same helical scan silicon (HSS) head, fabricated with advanced thin film technology. HSS heads feature unique properties such as an integrated solenoid coil (DC resistance <8 Ω for 40 turns), and very small pole widths. The very good alignment of the polar pieces is expected to minimize side effects. In this paper, we report μtrack profile measurements for investigation of track edge behavior of HSS heads in combination with MP and ME tapes. Heads with optical pole widths as narrow as 3.3 μm and 0.11 μm gap length have been studied. Narrower tracks are obtained by recording a first track and partially erasing it from one side by writing a second track at a different wavelength. The positioning accuracy achieved, better than 0.1 μm with all precautions, allows use of this method for side erasure measurements. Using a 0.5 μm wavelength track to partially overwrite a 0.4 μm wavelength we find a side erasure band of 0.3 μm (with MP tape, Hc=135 kA/m). Results are compared with MFM observations and qualitative agreement is proved. We also describe novel profiling methods for quantifying side reading, and report experimental results. The difference between the side erasure band (SEB) and the side reading band (SRB) can be determined by writing a track in the middle of two adjacent tracks having different wavelengths. All wavelengths are read during the same scan.

Original language	Undefined
DOIs	https://doi.org/10.1109/INTMAG.2002.1000652
Publication status	Published - 2002
Event	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - RAI Congress Center, Amsterdam, Netherlands Duration: 28 Apr 2002 → 2 May 2002

Conference

Conference	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Abbreviated title	INTERMAG Europe 2002
Country	Netherlands
City	Amsterdam
Period	28/04/02 → 2/05/02

Keywords

IR-55900

Access to Document

10.1109/INTMAG.2002.1000652

Cite this

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title = "μtrack profiles for investigating side effects of advanced silicon heads for helical scan tape systems",

abstract = "Track and μtrack scans are common techniques in hard disk systems for investigating side writing and side reading, and for characterizing the response of MR read heads. These methods are implemented less in tape systems, where the contact recording mode and flexible medium make it difficult to obtain a smooth relative movement between head and medium. Positioning instability generates fluctuations in track profiles (S. Fukuda et al, 2000). We optimized an experimental system, using helical scan type heads and tape wound on a rotary drum, for measuring sub-μm track profiles. Writing and reading operations are performed with the same helical scan silicon (HSS) head, fabricated with advanced thin film technology. HSS heads feature unique properties such as an integrated solenoid coil (DC resistance <8 Ω for 40 turns), and very small pole widths. The very good alignment of the polar pieces is expected to minimize side effects. In this paper, we report μtrack profile measurements for investigation of track edge behavior of HSS heads in combination with MP and ME tapes. Heads with optical pole widths as narrow as 3.3 μm and 0.11 μm gap length have been studied. Narrower tracks are obtained by recording a first track and partially erasing it from one side by writing a second track at a different wavelength. The positioning accuracy achieved, better than 0.1 μm with all precautions, allows use of this method for side erasure measurements. Using a 0.5 μm wavelength track to partially overwrite a 0.4 μm wavelength we find a side erasure band of 0.3 μm (with MP tape, Hc=135 kA/m). Results are compared with MFM observations and qualitative agreement is proved. We also describe novel profiling methods for quantifying side reading, and report experimental results. The difference between the side erasure band (SEB) and the side reading band (SRB) can be determined by writing a track in the middle of two adjacent tracks having different wavelengths. All wavelengths are read during the same scan.",

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author = "A. Hozoi and J.P.J. Groenland and J.C. Lodder and J.B. Albertini",

year = "2002",

doi = "10.1109/INTMAG.2002.1000652",

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note = "null ; Conference date: 28-04-2002 Through 02-05-2002",

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T1 - μtrack profiles for investigating side effects of advanced silicon heads for helical scan tape systems

AU - Hozoi, A.

AU - Groenland, J.P.J.

AU - Lodder, J.C.

AU - Albertini, J.B.

PY - 2002

Y1 - 2002

N2 - Track and μtrack scans are common techniques in hard disk systems for investigating side writing and side reading, and for characterizing the response of MR read heads. These methods are implemented less in tape systems, where the contact recording mode and flexible medium make it difficult to obtain a smooth relative movement between head and medium. Positioning instability generates fluctuations in track profiles (S. Fukuda et al, 2000). We optimized an experimental system, using helical scan type heads and tape wound on a rotary drum, for measuring sub-μm track profiles. Writing and reading operations are performed with the same helical scan silicon (HSS) head, fabricated with advanced thin film technology. HSS heads feature unique properties such as an integrated solenoid coil (DC resistance <8 Ω for 40 turns), and very small pole widths. The very good alignment of the polar pieces is expected to minimize side effects. In this paper, we report μtrack profile measurements for investigation of track edge behavior of HSS heads in combination with MP and ME tapes. Heads with optical pole widths as narrow as 3.3 μm and 0.11 μm gap length have been studied. Narrower tracks are obtained by recording a first track and partially erasing it from one side by writing a second track at a different wavelength. The positioning accuracy achieved, better than 0.1 μm with all precautions, allows use of this method for side erasure measurements. Using a 0.5 μm wavelength track to partially overwrite a 0.4 μm wavelength we find a side erasure band of 0.3 μm (with MP tape, Hc=135 kA/m). Results are compared with MFM observations and qualitative agreement is proved. We also describe novel profiling methods for quantifying side reading, and report experimental results. The difference between the side erasure band (SEB) and the side reading band (SRB) can be determined by writing a track in the middle of two adjacent tracks having different wavelengths. All wavelengths are read during the same scan.

AB - Track and μtrack scans are common techniques in hard disk systems for investigating side writing and side reading, and for characterizing the response of MR read heads. These methods are implemented less in tape systems, where the contact recording mode and flexible medium make it difficult to obtain a smooth relative movement between head and medium. Positioning instability generates fluctuations in track profiles (S. Fukuda et al, 2000). We optimized an experimental system, using helical scan type heads and tape wound on a rotary drum, for measuring sub-μm track profiles. Writing and reading operations are performed with the same helical scan silicon (HSS) head, fabricated with advanced thin film technology. HSS heads feature unique properties such as an integrated solenoid coil (DC resistance <8 Ω for 40 turns), and very small pole widths. The very good alignment of the polar pieces is expected to minimize side effects. In this paper, we report μtrack profile measurements for investigation of track edge behavior of HSS heads in combination with MP and ME tapes. Heads with optical pole widths as narrow as 3.3 μm and 0.11 μm gap length have been studied. Narrower tracks are obtained by recording a first track and partially erasing it from one side by writing a second track at a different wavelength. The positioning accuracy achieved, better than 0.1 μm with all precautions, allows use of this method for side erasure measurements. Using a 0.5 μm wavelength track to partially overwrite a 0.4 μm wavelength we find a side erasure band of 0.3 μm (with MP tape, Hc=135 kA/m). Results are compared with MFM observations and qualitative agreement is proved. We also describe novel profiling methods for quantifying side reading, and report experimental results. The difference between the side erasure band (SEB) and the side reading band (SRB) can be determined by writing a track in the middle of two adjacent tracks having different wavelengths. All wavelengths are read during the same scan.

KW - IR-55900

U2 - 10.1109/INTMAG.2002.1000652

DO - 10.1109/INTMAG.2002.1000652

M3 - Paper

Y2 - 28 April 2002 through 2 May 2002

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