1/f noise and microstructure in thin aluminum lines

E. Ochs; M. J.C. van den Homberg; P. F.A. Alkemade; K. Armbruster; A. Seeger; H. Stoll; A. H. Verbruggen

1/f noise and microstructure in thin aluminum lines

E. Ochs^*
, M. J.C. van den Homberg
, P. F.A. Alkemade
, K. Armbruster
, A. Seeger
, H. Stoll
, A. H. Verbruggen

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

Abstract

The temperature dependence of 1/f noise in a series of polycrystalline, bamboo-structured, or single-crystal aluminum lines of similar geometry and purity has been investigated by means of a highly sensitive noise spectrometer. The 1/f noise in the polycrystalline samples is significantly higher than in the single-crystal and bamboo-structured specimens. The high noise level in the polycrystals is attributed to thermally activated motion of atoms in grain boundaries. In the bamboo-structured and the single-crystal lines the 1/f noise shows a maximum at about 340 K with corresponding activation energies of about 0.8 eV. It is argued that the process responsible for these fluctuations is thermally activated migration of atoms along dislocations.

Original language	English
Title of host publication	Noise In Physical Systems And 1 F Fluctuations
Subtitle of host publication	Proceedings of the 14th International Conference
Editors	C. Claeys, E. Simoen
Publisher	World Scientific
Pages	415-418
Number of pages	4
ISBN (Print)	978-981-4546-14-0
Publication status	Published - Jul 1997
Externally published	Yes
Event	14th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 1997 - Leuven, Belgium Duration: 14 Jul 1997 → 18 Jul 1997 Conference number: 14

Conference

Conference	14th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 1997
Abbreviated title	ICNF
Country/Territory	Belgium
City	Leuven
Period	14/07/97 → 18/07/97

Keywords

ITC-CV

Access to Document

https://www.worldscientific.com/worldscibooks/10.1142/3479?srsltid=AfmBOoragv2wad2TfNXcEJx-TGUjhk0ze8-lGtpUtIyEyhRgdvAdyuMc#t=aboutBook

Cite this

Ochs, E., van den Homberg, M. J. C., Alkemade, P. F. A., Armbruster, K., Seeger, A., Stoll, H., & Verbruggen, A. H. (1997). 1/f noise and microstructure in thin aluminum lines. In C. Claeys, & E. Simoen (Eds.), Noise In Physical Systems And 1 F Fluctuations: Proceedings of the 14th International Conference (pp. 415-418). World Scientific. https://www.worldscientific.com/worldscibooks/10.1142/3479?srsltid=AfmBOoragv2wad2TfNXcEJx-TGUjhk0ze8-lGtpUtIyEyhRgdvAdyuMc#t=aboutBook

@inproceedings{65c1c3b97c2f4e12a52b9e012386e01b,

title = "1/f noise and microstructure in thin aluminum lines",

abstract = "The temperature dependence of 1/f noise in a series of polycrystalline, bamboo-structured, or single-crystal aluminum lines of similar geometry and purity has been investigated by means of a highly sensitive noise spectrometer. The 1/f noise in the polycrystalline samples is significantly higher than in the single-crystal and bamboo-structured specimens. The high noise level in the polycrystals is attributed to thermally activated motion of atoms in grain boundaries. In the bamboo-structured and the single-crystal lines the 1/f noise shows a maximum at about 340 K with corresponding activation energies of about 0.8 eV. It is argued that the process responsible for these fluctuations is thermally activated migration of atoms along dislocations.",

keywords = "ITC-CV",

author = "E. Ochs and \{van den Homberg\}, \{M. J.C.\} and Alkemade, \{P. F.A.\} and K. Armbruster and A. Seeger and H. Stoll and Verbruggen, \{A. H.\}",

year = "1997",

month = jul,

language = "English",

isbn = "978-981-4546-14-0",

pages = "415--418",

editor = "C. Claeys and E. Simoen",

booktitle = "Noise In Physical Systems And 1 F Fluctuations",

publisher = "World Scientific",

address = "United States",

note = "14th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 1997, ICNF ; Conference date: 14-07-1997 Through 18-07-1997",

}

Ochs, E, van den Homberg, MJC, Alkemade, PFA, Armbruster, K, Seeger, A, Stoll, H & Verbruggen, AH 1997, 1/f noise and microstructure in thin aluminum lines. in C Claeys & E Simoen (eds), Noise In Physical Systems And 1 F Fluctuations: Proceedings of the 14th International Conference . World Scientific, pp. 415-418, 14th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 1997, Leuven, Belgium, 14/07/97. <https://www.worldscientific.com/worldscibooks/10.1142/3479?srsltid=AfmBOoragv2wad2TfNXcEJx-TGUjhk0ze8-lGtpUtIyEyhRgdvAdyuMc#t=aboutBook>

1/f noise and microstructure in thin aluminum lines. / Ochs, E.; van den Homberg, M. J.C.; Alkemade, P. F.A. et al.
Noise In Physical Systems And 1 F Fluctuations: Proceedings of the 14th International Conference . ed. / C. Claeys; E. Simoen. World Scientific, 1997. p. 415-418.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - 1/f noise and microstructure in thin aluminum lines

AU - Ochs, E.

AU - van den Homberg, M. J.C.

AU - Alkemade, P. F.A.

AU - Armbruster, K.

AU - Seeger, A.

AU - Stoll, H.

AU - Verbruggen, A. H.

N1 - Conference code: 14

PY - 1997/7

Y1 - 1997/7

N2 - The temperature dependence of 1/f noise in a series of polycrystalline, bamboo-structured, or single-crystal aluminum lines of similar geometry and purity has been investigated by means of a highly sensitive noise spectrometer. The 1/f noise in the polycrystalline samples is significantly higher than in the single-crystal and bamboo-structured specimens. The high noise level in the polycrystals is attributed to thermally activated motion of atoms in grain boundaries. In the bamboo-structured and the single-crystal lines the 1/f noise shows a maximum at about 340 K with corresponding activation energies of about 0.8 eV. It is argued that the process responsible for these fluctuations is thermally activated migration of atoms along dislocations.

AB - The temperature dependence of 1/f noise in a series of polycrystalline, bamboo-structured, or single-crystal aluminum lines of similar geometry and purity has been investigated by means of a highly sensitive noise spectrometer. The 1/f noise in the polycrystalline samples is significantly higher than in the single-crystal and bamboo-structured specimens. The high noise level in the polycrystals is attributed to thermally activated motion of atoms in grain boundaries. In the bamboo-structured and the single-crystal lines the 1/f noise shows a maximum at about 340 K with corresponding activation energies of about 0.8 eV. It is argued that the process responsible for these fluctuations is thermally activated migration of atoms along dislocations.

KW - ITC-CV

M3 - Conference contribution

AN - SCOPUS:0031295476

SN - 978-981-4546-14-0

SP - 415

EP - 418

BT - Noise In Physical Systems And 1 F Fluctuations

A2 - Claeys, C.

A2 - Simoen, E.

PB - World Scientific

T2 - 14th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 1997

Y2 - 14 July 1997 through 18 July 1997

ER -

1/f noise and microstructure in thin aluminum lines

Abstract

Conference

Keywords

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