(305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films

W.A.M. Aarnink, E.M.C.M. Reuvekamp, M.A.J. Verhoeven, M.V. Pedyash, G.J. Gerritsma, A. van Silfhout, H. Rogalla, T.W. Ryan

Research output: Contribution to journalArticleAcademicpeer-review

25 Citations (Scopus)
161 Downloads (Pure)


High Tc superconducting YBa2Cu3Ox (YBCO) thin films have been prepared on (305) SrTiO3 (STO) substrates. X‐ray diffraction analysis and Rutherford backscattering experiments reveal that the c‐axis of the layers is directed along the [001] STO axis. Bragg reflection measurements from YBCO lattice planes with high h, k, and l indices confirm that the film growth is epitaxial and almost single domain. For the critical current density jc(77 K) values of 2×106 and 1×103 A/cm2 have been found in the [010] and [501̄] YBCO directions, respectively.
Original languageEnglish
Pages (from-to)607-609
Number of pages3
JournalApplied physics letters
Issue number5
Publication statusPublished - 1992


Dive into the research topics of '(305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films'. Together they form a unique fingerprint.

Cite this