(305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films

W.A.M. Aarnink; E.M.C.M. Reuvekamp; M.A.J. Verhoeven; M.V. Pedyash; G.J. Gerritsma; A. van Silfhout; H. Rogalla; T.W. Ryan

doi:10.1063/1.107851

(305) SrTiO₃ as substrate for coherently tilted epitaxial YBa₂Cu₃O_x thin films

W.A.M. Aarnink, E.M.C.M. Reuvekamp, M.A.J. Verhoeven, M.V. Pedyash, G.J. Gerritsma, A. van Silfhout, H. Rogalla, T.W. Ryan

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Abstract

High Tc superconducting YBa2Cu3Ox (YBCO) thin films have been prepared on (305) SrTiO3 (STO) substrates. X‐ray diffraction analysis and Rutherford backscattering experiments reveal that the c‐axis of the layers is directed along the [001] STO axis. Bragg reflection measurements from YBCO lattice planes with high h, k, and l indices confirm that the film growth is epitaxial and almost single domain. For the critical current density jc(77 K) values of 2×106 and 1×103 A/cm2 have been found in the [010] and [501̄] YBCO directions, respectively.

Original language	English
Pages (from-to)	607-609
Number of pages	3
Journal	Applied physics letters
Volume	61
Issue number	5
DOIs	https://doi.org/10.1063/1.107851
Publication status	Published - 1992

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@article{90957187178b4a7fa4ff07b6e800b1e9,

title = "(305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films",

abstract = "High Tc superconducting YBa2Cu3Ox (YBCO) thin films have been prepared on (305) SrTiO3 (STO) substrates. X‐ray diffraction analysis and Rutherford backscattering experiments reveal that the c‐axis of the layers is directed along the [001] STO axis. Bragg reflection measurements from YBCO lattice planes with high h, k, and l indices confirm that the film growth is epitaxial and almost single domain. For the critical current density jc(77 K) values of 2×106 and 1×103 A/cm2 have been found in the [010] and [50{\=1}] YBCO directions, respectively.",

author = "W.A.M. Aarnink and E.M.C.M. Reuvekamp and M.A.J. Verhoeven and M.V. Pedyash and G.J. Gerritsma and {van Silfhout}, A. and H. Rogalla and T.W. Ryan",

year = "1992",

doi = "10.1063/1.107851",

language = "English",

volume = "61",

pages = "607--609",

journal = "Applied physics letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "5",

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TY - JOUR

T1 - (305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films

AU - Aarnink, W.A.M.

AU - Reuvekamp, E.M.C.M.

AU - Verhoeven, M.A.J.

AU - Pedyash, M.V.

AU - Gerritsma, G.J.

AU - van Silfhout, A.

AU - Rogalla, H.

AU - Ryan, T.W.

PY - 1992

Y1 - 1992

N2 - High Tc superconducting YBa2Cu3Ox (YBCO) thin films have been prepared on (305) SrTiO3 (STO) substrates. X‐ray diffraction analysis and Rutherford backscattering experiments reveal that the c‐axis of the layers is directed along the [001] STO axis. Bragg reflection measurements from YBCO lattice planes with high h, k, and l indices confirm that the film growth is epitaxial and almost single domain. For the critical current density jc(77 K) values of 2×106 and 1×103 A/cm2 have been found in the [010] and [501̄] YBCO directions, respectively.

AB - High Tc superconducting YBa2Cu3Ox (YBCO) thin films have been prepared on (305) SrTiO3 (STO) substrates. X‐ray diffraction analysis and Rutherford backscattering experiments reveal that the c‐axis of the layers is directed along the [001] STO axis. Bragg reflection measurements from YBCO lattice planes with high h, k, and l indices confirm that the film growth is epitaxial and almost single domain. For the critical current density jc(77 K) values of 2×106 and 1×103 A/cm2 have been found in the [010] and [501̄] YBCO directions, respectively.

U2 - 10.1063/1.107851

DO - 10.1063/1.107851

M3 - Article

VL - 61

SP - 607

EP - 609

JO - Applied physics letters

JF - Applied physics letters

SN - 0003-6951

IS - 5

ER -

(305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films

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(305) SrTiO₃ as substrate for coherently tilted epitaxial YBa₂Cu₃O_x thin films