5.5V Tolerant I/O in a 2.5V 0.25um CMOS Technology

Anne J. Annema, Govert Geelen, Peter de Jong

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Abstract

    Robust high-voltage tolerant U0 that do not need process options is presented, demonstrated on 5.5V tolerant opendrain U0 in a 2.5V 0 . 2 5 C~M OS technology. Circuit techniques limit oxide stress and hot-carrier degradation, resulting in hundreds of years extrapolated lifetime for 5.5V pad voltage swing, 2.2V supply voltage, lOMHz switching frequency. The shown concepts are also implemented in other types of U0 and can easily be scaled towards newer processes.
    Original languageUndefined
    Title of host publicationIEEE Custom Integrated Circuit Conference 2000
    PublisherIEEE
    Pages417-420
    ISBN (Print)07803-5809-0
    DOIs
    Publication statusPublished - 24 May 2000
    EventIEEE Custom Integrated Circuit Conference, CICC 2000 - Orlando, FL, USA
    Duration: 21 May 200024 May 2000

    Publication series

    Name
    PublisherIEEE

    Conference

    ConferenceIEEE Custom Integrated Circuit Conference, CICC 2000
    Period21/05/0024/05/00
    OtherMay 21-24, 2000

    Keywords

    • METIS-112979
    • IR-16094

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