Robust high-voltage tolerant U0 that do not need process options is presented, demonstrated on 5.5V tolerant opendrain U0 in a 2.5V 0 . 2 5 C~M OS technology. Circuit techniques limit oxide stress and hot-carrier degradation, resulting in hundreds of years extrapolated lifetime for 5.5V pad voltage swing, 2.2V supply voltage, lOMHz switching frequency. The shown concepts are also implemented in other types of U0 and can easily be scaled towards newer processes.
|Conference||IEEE Custom Integrated Circuit Conference, CICC 2000|
|Period||21/05/00 → 24/05/00|
|Other||May 21-24, 2000|