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  • 2019
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  • 2011

Author

  • Jurriaan Schmitz
4 Citations (Scopus)
1 Downloads (Pure)

Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit

Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P., 2019. 1 p.

Research output: Contribution to conferenceAbstract

Open Access
File
17 Downloads (Pure)

Analysis of thin-film PZT/LNO stacks on an encapsulated TiN electrode

Kaleli, B., Nguyen, D. M., Schmitz, J., Wolters, R. A. M. & Hueting, R. J. E., 1 May 2014, In : Microelectronic engineering. 119, p. 16-19 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

A nitride-based epitaxial surface layer formed by ammonia treatment of silicene-terminated ZrB2

Wiggers, F. B., Van Hao, B., Friedlein, R., Yamada-Takamura, Y., Schmitz, J., Kovalgin, A. Y. & de Jong, M. P., 5 Apr 2016, In : Journal of chemical physics. 144, 134703, p. 1-5 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)

Characterization of Green Laser Crystallized GeSi Thin Films

Rangarajan, B., Brunets, I., Oesterlin, P., Kovalgin, A. Y. & Schmitz, J., 2011, Amorphous and Polycrystalline Thin-Film Silicon Science and Technology 2011. p. a06-04 6 p. (MRS online proceedings; vol. 1321).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

37 Downloads (Pure)

Characterization of recessed Ohmic contacts to AlGaN/GaN

Hajlasz, M., Donkers, J. J. T. M., Sque, S. J., Heil, S. B. S., Gravesteijn, D. J., Rietveld, F. J. R. & Schmitz, J., 23 Mar 2015, Proceedings of the International Conference on Microelectronic Test Structures, ICMTS 2015. USA: IEEE Solid-State Circuits Society, p. 158-162 5 p. (Proceedings of the IEEE International Conference on Microelectronic Test Structures).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Charge protection characterisation and drift time resolution improvement for GridPix

Koppert, W. J. C., Fransen, M., van Bakel, N., van der Graaf, H., Hartjes, F., Timmermans, J., Visser, J., Kluit, R., Gromov, V., Zappon, F., Blanco Carballo, V. M., Schmitz, J., Bilevych, Y. & Bilevych, Y., 23 Oct 2011, IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011. USA: IEEE, p. 1799-1802 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

CMOS post-processing for monolithic microsystems

Schmitz, J., 11 Mar 2014, Nano and Giga Challenges in Electronics, Photonics and Renewable Energy, Nano & Giga 2014. Tempe, Arizona, USA: Arizona State University, p. - 1 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Comparison of C-V measurement methods for RF-MEMS capacitive switches

Wang, J., Salm, C. & Schmitz, J., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures, ICMTS 2013. USA: IEEE Electron Devices Society, p. 53-58 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Comparison of electrical techniques for temperature evaluation in power MOS transistors

Ferrara, A., Steeneken, P. G., Reimann, K., Heringa, A., Yan, L., Boksteen, B. K., Swanenberg, M., Koops, G. E. J., Scholten, A. J., Surdeanu, R., Schmitz, J. & Hueting, R. J. E., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures (ICMTS 2013). USA: IEEE, p. 115-120 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)
Open Access
File
8 Citations (Scopus)
39 Downloads (Pure)

Conduction and electric field effect in ultra-thin TiN films

Van Hao, B., Kovalgin, A. Y., Schmitz, J. & Wolters, R. A. M., 31 Jul 2013, In : Applied physics letters. 103, 5, p. 051904 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

13 Citations (Scopus)
1 Downloads (Pure)

Deep reactive ion etching of in situ boron doped LPCVD Ge0.7Si0.3 using SF6 and O2 plasma

Kazmi, S. N. R., Salm, C. & Schmitz, J., Oct 2013, In : Microelectronic engineering. 110, p. 311-314 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Degradation and reliability of silicon power transistors

Schmitz, J., Oct 2013, 2013 IEEE International Integrated Reliability Workshop Final Report.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Deposition and properties of silicon oxynitride films with low propagation losses by inductively coupled PECVD at 150 °C

Rangarajan, B., Kovalgin, A. Y. & Schmitz, J., 15 Sep 2013, In : Surface and coatings technology. 230, p. 46-50 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
Open Access
File
132 Downloads (Pure)

Editorial: Extended papers selected from ESSDERC 2015

Grasser, T., Schmitz, J. & Lemme, M. C., 1 Nov 2016, In : Solid-state electronics. 125, p. 1-1 1 p.

Research output: Contribution to journalArticleAcademicpeer-review

File
42 Downloads (Pure)
3 Citations (Scopus)
1 Downloads (Pure)

Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films

van der Zouw, K., Aarnink, A. A. I., Schmitz, J. & Kovalgin, A. Y., 18 Mar 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 48-53 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
1 Citation (Scopus)
59 Downloads (Pure)

Electrical test structures for verifying continuity of ultra-thin insulating and conducting films

Banerjee, S., van der Velde, F. J., Yang, M., Schmitz, J. & Kovalgin, A. Y., 28 Mar 2017, Electrical test structures for verifying continuity of ultra-thin insulating and conducting films. New York: IEEE, p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Electric field and interface charge extraction in field-plate assisted RESURF devices

Boksteen, B. K., Heringa, A., Ferrara, A., Steeneken, P. G., Schmitz, J. & Hueting, R. J. E., 1 Feb 2015, In : IEEE transactions on electron devices. 62, 2, p. 622-629 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Exploring Capacitance-Voltage measurements to find the Piezoelectric Coefficient of Aluminum Nitride

van Hemert, T., Sakriotis, D., Hueting, R. J. E. & Schmitz, J., 4 Apr 2011, 24th International Conference on Microelectronic Test Structures, ICMTS 2011. USA: IEEE Electron Devices Society, p. 69-73 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Extracting the Conduction Band Offset in Strained FinFETs from Subthreshold-Current Measurements

van Hemert, T., Kaleli, B., Hueting, R. J. E., Esseni, D., van Dal, M. J. H. & Schmitz, J., 12 Sep 2011, Proceedings of the 41st European Solid-State Device Research Conference (Essderc 2011). USA: IEEE Solid-State Circuits Society, p. 275-278 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Fabrication and properties of GeSi and SiON layers for above-IC integrated optics

Schmitz, J., Rangarajan, B. & Kovalgin, A. Y., Jun 2015, In : Solid-state electronics. 108, p. 8-12 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

File
4 Citations (Scopus)
25 Downloads (Pure)

Gap-closing test structures for temperature budget determination

Faber, E. J., Wolters, R. A. M. & Schmitz, J., 4 Apr 2011, 24th International Conference on Microelectronic Test Structures, ICMTS 2011. USA: IEEE Electron Devices Society, p. 165-169 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Green Laser Crystallization of GeSi thin Films and Dopant Activation

Rangarajan, B., Brunets, I., Oesterlin, P., Kovalgin, A. Y. & Schmitz, J., 1 May 2011, 219th ECS Meeting Transactions. The Electrochemical Society Inc., p. 17-25 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

GridPix detectors: production and beam test results

Koppert, W. J. C., van Bakel, N., Bilevych, Y., Bilevych, Y., Colas, P., Desch, K., Fransen, M., van der Graaf, H., Hartjes, F., Hessey, N. P., Kaminski, J., Schmitz, J., Schön, R. & Zappon, F., Dec 2013, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 732, p. 245-249 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Growth and properties of subnanometer thin titanium nitride films

Kovalgin, A. Y., Van Hao, B., Schmitz, J. & Wolters, R. A. M., 10 Mar 2014, p. 1.

Research output: Contribution to conferenceAbstract

File
23 Downloads (Pure)

Growth Kinetics and Oxidation Mechanism of ALD TiN Thin Films Monitored by In Situ Spectroscopic Ellipsometry

Van Hao, B., Groenland, A. W., Aarnink, A. A. I., Wolters, R. A. M., Schmitz, J. & Kovalgin, A. Y., 3 Jan 2011, In : Journal of the Electrochemical Society. 158, 3, p. 214-220 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

45 Citations (Scopus)
1 Downloads (Pure)

Hot-wire assisted ALD of tungsten films: In-situ study of the interplay between CVD, etching, and ALD modes

Yang, M., Aarnink, A. A. I., Kovalgin, A. Y., Wolters, R. A. M. & Schmitz, J., 25 May 2015, In : Physica status solidi A. 212, 7, p. 1607-1614 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

11 Citations (Scopus)

How hot is the wire: Optical, electrical, and combined methods to determine filament temperature

Onnink, A. J., Schmitz, J. & Kovalgin, A. Y., 31 Mar 2019, In : Thin solid films. 674, p. 22-32 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
41 Downloads (Pure)

Humidity and polarity influence on MIM PZT capacitor degradation and breakdown

Wang, J., Salm, C., Houwman, E., Schmitz, J. & Nguyen, M., 9 Oct 2016, 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, p. 65-68 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
1 Citation (Scopus)
56 Downloads (Pure)

Ideal RESURF Geometries

Ferrara, A., Boksteen, B. K., Hueting, R. J. E., Heringa, A., Schmitz, J. & Steeneken, P. G., 1 Oct 2015, In : IEEE transactions on electron devices. 62, 10, p. 3341-3347 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

7 Citations (Scopus)

Identifying failure mechanisms in LDMOS transistors by analytical stability analysis

Ferrara, A., Steeneken, P. G., Boksteen, B. K., Heringa, A., Scholten, A. J., Schmitz, J. & Hueting, R. J. E., 22 Sep 2014, Proceedings of the 44th European Solid State Device Research Conference, ESSDERC 2014. USA: IEEE Circuits & Systems Society, p. 321-324 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Increased light emission by geometrical changes in Si LEDs

Puliyankot Palackavalapil, V., Piccolo, G., Hueting, R. J. E., Heringa, A., Kovalgin, A. Y. & Schmitz, J., 14 Sep 2011, Proceedings of the 8th International Conference on Group IV Photonics (GFP). USA: IEEE Photonics Society, p. 287-289 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
1 Downloads (Pure)

In-situ study of ammonium bromide formation for optimizing boron nitride ALD from BBr3 and NH3

Onnink, A. J., Apaydin, R. O., Schmitz, J. & Kovalgin, A. Y., 2019.

Research output: Contribution to conferenceAbstract

Integration of Solar Cells on Top of CMOS Chips Part I: a-Si Solar Cells

Lu, J., Kovalgin, A. Y., van der Werf, K. H. M., Schropp, R. E. I. & Schmitz, J., 1 Jul 2011, In : IEEE transactions on electron devices. 58, 5, p. 2014-2021 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

File
15 Citations (Scopus)
48 Downloads (Pure)

Integration of Solar Cells on Top of CMOS Chips - Part II: CIGS Solar Cells

Lu, J., Liu, W., Kovalgin, A. Y., Sun, Y. & Schmitz, J., 1 Aug 2011, In : IEEE transactions on electron devices. 58, 8, p. 2620-2627 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

File
7 Citations (Scopus)
51 Downloads (Pure)

Interface trap density estimation in FinFETs from the subthreshold current

Schmitz, J., Kaleli, B., Kuipers, P., van den Berg, N., Smits, S. M. & Hueting, R. J. E., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 164-167 4 p. (Proceedings International Conference on Microelectronic Test Structures (ICMTS); vol. 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Citation (Scopus)
18 Downloads (Pure)

Interface trap density estimation in FinFETs using the gm/ID Method in the subthreshold regime

Boksteen, B. K., Schmitz, J. & Hueting, R. J. E., May 2016, In : IEEE transactions on electron devices. 63, 5, p. 1814-1820 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Light emission enhancement by geometrical scaling of carrier injectors in Si-based LEDs

Piccolo, G., Puliyankot Palackavalapil, V., Kovalgin, A. Y., Hueting, R. J. E., Heringa, A. & Schmitz, J., 12 Sep 2011, 2011 Proceedings of the 41st European Solid-State Device Research Conference (Essderc). USA: IEEE Solid-State Circuits Society, p. 175-178 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Low Stress In Situ Boron Doped Poly SiGe Layers for MEMS Modular Integration with CMOS

Kazmi, S. N. R., Aarnink, A. A. I., Kovalgin, A. Y., Salm, C. & Schmitz, J., 1 May 2011, In : ECS transactions. 35, 30, p. 45-52 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Low-temperature deposition of high-quality siliconoxynitride films for CMOS-integrated optics

Rangarajan, B., Kovalgin, A. Y., Worhoff, K. & Schmitz, J., 13 Mar 2013, In : Optics letters. 38, 6, p. 941-943 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

15 Citations (Scopus)

Low temperature thin films for next-generation microelectronics

Schmitz, J., 22 May 2017. 1 p.

Research output: Contribution to conferencePoster

Material properties of LPCVD processed n-type polysilicon passivating contacts and its application in PERPoly industrial bifacial solar cells

Stodolny, M. K., Anker, J., Geerligs, B. L. J., Janssen, G. J. M., van de Loo, B. W. H., Melskens, J., Santbergen, R., Isabella, O., Schmitz, J., Lenes, M., Luchies, J. M., Kessels, W. M. M. & Romijn, I., 2017, In : Energy procedia. 124, p. 635-642 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
32 Citations (Scopus)
393 Downloads (Pure)

Materials and integration schemes for above-IC integrated optics

Schmitz, J., Rangarajan, B. & Kovalgin, A. Y., 7 Apr 2014, 15th International Conference on Ultimate Integration on Silicon, ULIS 2014. USA: IEEE Circuits & Systems Society, p. 153-156 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Materials Characterization of CIGS solar cells on Top of CMOS chips

Lu, J., Liu, W., Kovalgin, A. Y., Sun, Y. & Schmitz, J., 1 Jun 2011, Proceedings of 2011 MRS Spring Meeting. Venkatasubramanian, R., Radousky, H. & Liang, H. (eds.). Cambridge, UK: Cambridge University Press, p. e06-23 8 p. (MRS proceedings; vol. 1325).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
65 Downloads (Pure)

Mechanical resonators on CMOS for integrated passive band pass filters

Kazmi, S. N. R., Salm, C. & Schmitz, J., 23 Jul 2013, ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'. p. 193-196 4 p. 6523517. (ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day').

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Meer More

Schmitz, J., Nauta, B. & Seijlhouwer, M., Aug 2016, In : Ingenieur. 128, 8, p. 30-33 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

8 Downloads (Pure)