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• Conference contribution

  Degradation and reliability of silicon power transistors

  Schmitz, J., Oct 2013, 2013 IEEE International Integrated Reliability Workshop Final Report.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

• Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films

  van der Zouw, K., Aarnink, A. A. I., Schmitz, J. & Kovalgin, A. Y., 18 Mar 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 48-53 6 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  Open Access

  File

  • Atomic layer deposition
  • Sheet resistance
  • Contact resistance
  • Tungsten
  • Characterization (materials science)
  1 Citation (Scopus)

  64 Downloads (Pure)

• Electrical test structures for verifying continuity of ultra-thin insulating and conducting films

  Banerjee, S., van der Velde, F. J., Yang, M., Schmitz, J. & Kovalgin, A. Y., 28 Mar 2017, Electrical test structures for verifying continuity of ultra-thin insulating and conducting films. New York: IEEE, p. 1-6 6 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • continuity
  • conduction
  • aluminum nitrides
  • closures
  • ellipsometry

• Humidity and polarity influence on MIM PZT capacitor degradation and breakdown

  Wang, J., Salm, C., Houwman, E., Schmitz, J. & Nguyen, M., 9 Oct 2016, 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, p. 65-68 4 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

  Open Access

  File

  • MIM (semiconductors)
  • humidity
  • polarity
  • capacitors
  • breakdown
  1 Citation (Scopus)

  62 Downloads (Pure)

• Identifying failure mechanisms in LDMOS transistors by analytical stability analysis

  Ferrara, A., Steeneken, P. G., Boksteen, B. K., Heringa, A., Scholten, A. J., Schmitz, J. & Hueting, R. J. E., 22 Sep 2014, Proceedings of the 44th European Solid State Device Research Conference, ESSDERC 2014. USA: IEEE Circuits & Systems Society, p. 321-324 4 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
  1 Citation (Scopus)

• Interface trap density estimation in FinFETs from the subthreshold current

  Schmitz, J., Kaleli, B., Kuipers, P., van den Berg, N., Smits, S. M. & Hueting, R. J. E., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 164-167 4 p. (Proceedings International Conference on Microelectronic Test Structures (ICMTS); vol. 2016).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  File

  • traps
  • transconductance
  • wafers
  • electric potential
  • temperature
  1 Citation (Scopus)

  29 Downloads (Pure)

• Materials and integration schemes for above-IC integrated optics

  Schmitz, J., Rangarajan, B. & Kovalgin, A. Y., 7 Apr 2014, 15th International Conference on Ultimate Integration on Silicon, ULIS 2014. USA: IEEE Circuits & Systems Society, p. 153-156 4 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

• Mechanical resonators on CMOS for integrated passive band pass filters

  Kazmi, S. N. R., Salm, C. & Schmitz, J., 23 Jul 2013, ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'. p. 193-196 4 p. 6523517. (ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day').

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Passive filters
  • Bandpass filters
  • Resonators
  • Germanium
  • Boron

• Micro- and nano-link ultra-low power heaters for sensors

  Groenland, A. W., Vereshchagina, E., Kovalgin, A. Y., Wolters, R. A. M., Gardeniers, J. G. E. & Schmitz, J., 17 Sep 2012, European Solid-State Device Research Conference, ESSDERC 2012. USA: IEEE Solid-State Circuits Society, p. 169-172 4 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
  2 Citations (Scopus)

  2 Downloads (Pure)

• On the degradation of field-plate assisted RESURF power devices

  Boksteen, B. K., Dhar, S., Ferrara, A., Heringa, A., Hueting, R. J. E., Koops, G. E. J., Salm, C. & Schmitz, J., 10 Dec 2012, IEEE International Electron Devices Meeting, IEDM 2012. San Francisco - USA: IEEE International Electron Device Meeting, p. 311-314 4 p. (Technical Digest).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
  3 Citations (Scopus)

• Prospects of efficient band-to-band emission in silicon LEDs

  Schmitz, J., 3 Feb 2017, Fourth Conference on Sensors, MEMS, and Electro-Optic Systems: 18–20 September 2016, Skukuza, Kruger National Park, South Africa. du Plessis, M. (ed.). SPIE, p. 2-7 6 p. (Proceedings of SPIE; vol. 10036).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  File

  • light emission
  • quantum efficiency
  • light emitting diodes
  • diodes
  • structural design
  25 Downloads (Pure)

• Role of junction depth in light emission from silicon p-i-n LEDs

  Piccolo, G., Sammak, A., Hueting, R. J. E., Schmitz, J. & Nanver, L. K., 16 Sep 2013, Proceeding of European Solid State Device Research Conference (ESSDERC 2013). USA: IEEE, p. 119-122 4 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

• Silicon LEDs in FinFET technology

  Piccolo, G., Kuindersma, P. I., Ragnarsson, L-A., Hueting, R. J. E., Collaert, N. & Schmitz, J., 26 Sep 2014, Proceeding ofthe 44th European Solid State Device Research Conference (ESSDERC). USA: IEEE Circuits & Systems Society, p. 274-277 4 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
  12 Citations (Scopus)

• Spring-constant measurement methods for RF-MEMS capacitive switches

  Wang, J., Bielen, J., Salm, C. & Schmitz, J., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 10-14 5 p. (International Conference on Microelectronic Test Structures (ICMTS); vol. 2016).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  Open Access

  File

  • MEMS
  • Switches
  • Capacitance
  • Finite element method
  17 Downloads (Pure)

• The boost transistor: a field plate controlled LDMOST

  Ferrara, A., Schmitz, J., Boksteen, B. K., Hueting, R. J. E., Steeneken, P. G., Heringa, A., Claes, J. & van der Wel, A. P., 10 May 2015, 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD). USA: IEEE, p. 165-168 4 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • acceleration (physics)
  • transistors
  • electrodes
  • electrical faults
  • electric potential
  2 Citations (Scopus)

• The safe operating volume as a general measure for the operating limits of LDMOS transistors

  Ferrara, A., Steeneken, P. G., Heringa, A., Boksteen, B. K., Swanenberg, M., Scholten, A. J., van Dijk, L., Schmitz, J. & Hueting, R. J. E., 9 Dec 2013, International Electron Devices Meeting (IEDM 2013). USA: IEEE Electron Devices Society, p. 6.7.1-6.7.4 4 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
  1 Citation (Scopus)
• Paper

  Deposition of thin layers containing Ga, C and N by sequential pulses of Trimethylgallium and Ammonia

  Banerjee, S., Aarnink, A. A. I., Kip, G. A. M., Gravesteijn, D. J., Schmitz, J. & Kovalgin, A. Y., 25 Jul 2016. 1 p.

  Research output: Contribution to conference › Paper › Academic

  Open Access

  File

  • gallium nitrides
  • gallium
  • ammonia
  • pulses
  • carbon
  142 Downloads (Pure)

• State of the art in microfabrication

  Schmitz, J., 2 Jun 2014, p. 1-10. 10 p.

  Research output: Contribution to conference › Paper › Academic › peer-review
  2 Downloads (Pure)

• TCAD analysis of wide-spectrum waveguide in high-voltage SOI CMOS

  Dutta, S., Orbe, L. & Schmitz, J., 15 Aug 2017. 2 p.

  Research output: Contribution to conference › Paper › Academic › peer-review

  • CMOS
  • high voltages
  • insulators
  • waveguides
  • transmission efficiency
  1 Downloads (Pure)
• Poster

  Analysis of ferroelectric and electrical properties of sub 100 nm thick PZT/LNO stacks on an encapsulated TiN electrode

  Kaleli, B., Nguyen, D. M., Schmitz, J., Wolters, R. A. M. & Hueting, R. J. E., 16 Sep 2013, p. -.

  Research output: Contribution to conference › Poster › Other research output

• Low temperature thin films for next-generation microelectronics

  Schmitz, J., 22 May 2017. 1 p.

  Research output: Contribution to conference › Poster › Other research output