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  • Jurriaan Schmitz
2019

Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit

Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P., 2019. 1 p.

Research output: Contribution to conferenceAbstract

Open Access
File
17 Downloads (Pure)

Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films

van der Zouw, K., Aarnink, A. A. I., Schmitz, J. & Kovalgin, A. Y., 18 Mar 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 48-53 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
1 Citation (Scopus)
49 Downloads (Pure)

How hot is the wire: Optical, electrical, and combined methods to determine filament temperature

Onnink, A. J., Schmitz, J. & Kovalgin, A. Y., 31 Mar 2019, In : Thin solid films. 674, p. 22-32 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
33 Downloads (Pure)

In-situ study of ammonium bromide formation for optimizing boron nitride ALD from BBr3 and NH3

Onnink, A. J., Apaydin, R. O., Schmitz, J. & Kovalgin, A. Y., 2019.

Research output: Contribution to conferenceAbstract

Plantenna: towards a network of vegetation-integrated sensors for plant and environmental monitoring

ten Veldhuis, M-C., Uijlenhoet, R., Schmitz, J., Smolders, B., Nauta, B., Baltus, P., Makinwa, K. & Steeneken, P., 2019.

Research output: Contribution to conferenceAbstract

Open Access
File
11 Downloads (Pure)

Recovery after hot-carrier injection: Slow versus fast traps

de Jong, M. J., Salm, C. & Schmitz, J., 23 Sep 2019, In : Microelectronics reliability. 100-101, 5 p., 113318.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)
2 Downloads (Pure)
2017
3 Citations (Scopus)
1 Downloads (Pure)

Electrical test structures for verifying continuity of ultra-thin insulating and conducting films

Banerjee, S., van der Velde, F. J., Yang, M., Schmitz, J. & Kovalgin, A. Y., 28 Mar 2017, Electrical test structures for verifying continuity of ultra-thin insulating and conducting films. New York: IEEE, p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Low temperature thin films for next-generation microelectronics

Schmitz, J., 22 May 2017. 1 p.

Research output: Contribution to conferencePoster

Material properties of LPCVD processed n-type polysilicon passivating contacts and its application in PERPoly industrial bifacial solar cells

Stodolny, M. K., Anker, J., Geerligs, B. L. J., Janssen, G. J. M., van de Loo, B. W. H., Melskens, J., Santbergen, R., Isabella, O., Schmitz, J., Lenes, M., Luchies, J. M., Kessels, W. M. M. & Romijn, I., 2017, In : Energy procedia. 124, p. 635-642 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
31 Citations (Scopus)
372 Downloads (Pure)

Monolithic optical link in silicon-on-insulator CMOS technology

Dutta, S., Agarwal, V. V., Hueting, R. J. E., Schmitz, J. & Annema, A. J., 6 Mar 2017, In : Optics express. 25, 5, p. 5440-5456 17 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
16 Citations (Scopus)
84 Downloads (Pure)

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs

de Jong, M. J., Salm, C. & Schmitz, J., Sep 2017, In : Microelectronics reliability. 76-77, p. 136-140 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

7 Citations (Scopus)
2 Downloads (Pure)

Optical Power Efficiency Versus Breakdown Voltage of Avalanche-Mode Silicon LEDs in CMOS

Dutta, S., Wienk, G. J. M., Hueting, R. J. E., Schmitz, J. & Annema, A-J., 23 Jun 2017, In : IEEE electron device letters. 38, 7, p. 898-901 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
4 Downloads (Pure)

Process induced poling and plasma induced damage of thin films PZT

Wang, J., Houwman, E. P., Salm, C., Nguyen, D. M., Vergeer, K. & Schmitz, J., 17 Jan 2017, In : Microelectronic engineering. 177, p. 13-18 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)
2 Downloads (Pure)

Prospects of efficient band-to-band emission in silicon LEDs

Schmitz, J., 3 Feb 2017, Fourth Conference on Sensors, MEMS, and Electro-Optic Systems: 18–20 September 2016, Skukuza, Kruger National Park, South Africa. du Plessis, M. (ed.). SPIE, p. 2-7 6 p. (Proceedings of SPIE; vol. 10036).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
16 Downloads (Pure)

Study of screen printed metallization for polysilicon based passivating contacts

Çiftpinar, H. E., Stodolny, M. K., Wu, Y., Janssen, G. J. M., Löffler, J., Schmitz, J., Lenes, M., Luchies, J. M. & Geerligs, B. L. J., 2017, In : Energy procedia. 124, p. 851-861 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
23 Citations (Scopus)
373 Downloads (Pure)

TCAD analysis of wide-spectrum waveguide in high-voltage SOI CMOS

Dutta, S., Orbe, L. & Schmitz, J., 15 Aug 2017. 2 p.

Research output: Contribution to conferencePaper

1 Downloads (Pure)

The avalanche-mode superjunction LED

Dutta, S., Steeneken, P. G., Agarwal, V. V., Schmitz, J., Annema, A. J. & Hueting, R. J. E., Apr 2017, In : IEEE transactions on electron devices. 64, 4, p. 1612-1618 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
9 Citations (Scopus)
81 Downloads (Pure)
2016

A nitride-based epitaxial surface layer formed by ammonia treatment of silicene-terminated ZrB2

Wiggers, F. B., Van Hao, B., Friedlein, R., Yamada-Takamura, Y., Schmitz, J., Kovalgin, A. Y. & de Jong, M. P., 5 Apr 2016, In : Journal of chemical physics. 144, 134703, p. 1-5 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
Open Access
File
8 Citations (Scopus)
34 Downloads (Pure)
Open Access
File
129 Downloads (Pure)

Editorial: Extended papers selected from ESSDERC 2015

Grasser, T., Schmitz, J. & Lemme, M. C., 1 Nov 2016, In : Solid-state electronics. 125, p. 1-1 1 p.

Research output: Contribution to journalArticleAcademicpeer-review

File
38 Downloads (Pure)

Humidity and polarity influence on MIM PZT capacitor degradation and breakdown

Wang, J., Salm, C., Houwman, E., Schmitz, J. & Nguyen, M., 9 Oct 2016, 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, p. 65-68 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
1 Citation (Scopus)
55 Downloads (Pure)

Interface trap density estimation in FinFETs from the subthreshold current

Schmitz, J., Kaleli, B., Kuipers, P., van den Berg, N., Smits, S. M. & Hueting, R. J. E., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 164-167 4 p. (Proceedings International Conference on Microelectronic Test Structures (ICMTS); vol. 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Citation (Scopus)
15 Downloads (Pure)

Interface trap density estimation in FinFETs using the gm/ID Method in the subthreshold regime

Boksteen, B. K., Schmitz, J. & Hueting, R. J. E., May 2016, In : IEEE transactions on electron devices. 63, 5, p. 1814-1820 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Meer More

Schmitz, J., Nauta, B. & Seijlhouwer, M., Aug 2016, In : Ingenieur. 128, 8, p. 30-33 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

8 Downloads (Pure)

On the small-signal capacitance of RF MEMS switches at very low frequencies

Wang, J., Bielen, J., Salm, C., Krijnen, G. & Schmitz, J., 24 Aug 2016, In : Journal of the Electron Devices Society. 4, 6, p. 459-465 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
4 Citations (Scopus)
92 Downloads (Pure)

Spring-constant measurement methods for RF-MEMS capacitive switches

Wang, J., Bielen, J., Salm, C. & Schmitz, J., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 10-14 5 p. (International Conference on Microelectronic Test Structures (ICMTS); vol. 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
9 Downloads (Pure)
2014

Analysis of thin-film PZT/LNO stacks on an encapsulated TiN electrode

Kaleli, B., Nguyen, D. M., Schmitz, J., Wolters, R. A. M. & Hueting, R. J. E., 1 May 2014, In : Microelectronic engineering. 119, p. 16-19 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

CMOS post-processing for monolithic microsystems

Schmitz, J., 11 Mar 2014, Nano and Giga Challenges in Electronics, Photonics and Renewable Energy, Nano & Giga 2014. Tempe, Arizona, USA: Arizona State University, p. - 1 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Growth and properties of subnanometer thin titanium nitride films

Kovalgin, A. Y., Van Hao, B., Schmitz, J. & Wolters, R. A. M., 10 Mar 2014, p. 1.

Research output: Contribution to conferenceAbstract

File
23 Downloads (Pure)

Identifying failure mechanisms in LDMOS transistors by analytical stability analysis

Ferrara, A., Steeneken, P. G., Boksteen, B. K., Heringa, A., Scholten, A. J., Schmitz, J. & Hueting, R. J. E., 22 Sep 2014, Proceedings of the 44th European Solid State Device Research Conference, ESSDERC 2014. USA: IEEE Circuits & Systems Society, p. 321-324 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Materials and integration schemes for above-IC integrated optics

Schmitz, J., Rangarajan, B. & Kovalgin, A. Y., 7 Apr 2014, 15th International Conference on Ultimate Integration on Silicon, ULIS 2014. USA: IEEE Circuits & Systems Society, p. 153-156 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Sheet resistance under Ohmic contacts to AlGaN/GaN heterostructures

Hajlasz, M., Donkers, J. J. T. M., Sque, S. J., Heil, S. B. S., Gravesteijn, D. J., Rietveld, F. J. R. & Schmitz, J., 18 Jun 2014, In : Applied physics letters. 104, p. 242109 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

14 Citations (Scopus)

Silicon LEDs in FinFET technology

Piccolo, G., Kuindersma, P. I., Ragnarsson, L-A., Hueting, R. J. E., Collaert, N. & Schmitz, J., 26 Sep 2014, Proceeding ofthe 44th European Solid State Device Research Conference (ESSDERC). USA: IEEE Circuits & Systems Society, p. 274-277 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)

State of the art in microfabrication

Schmitz, J., 2 Jun 2014, p. 1-10. 10 p.

Research output: Contribution to conferencePaper

2 Downloads (Pure)

Comparison of C-V measurement methods for RF-MEMS capacitive switches

Wang, J., Salm, C. & Schmitz, J., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures, ICMTS 2013. USA: IEEE Electron Devices Society, p. 53-58 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Comparison of electrical techniques for temperature evaluation in power MOS transistors

Ferrara, A., Steeneken, P. G., Reimann, K., Heringa, A., Yan, L., Boksteen, B. K., Swanenberg, M., Koops, G. E. J., Scholten, A. J., Surdeanu, R., Schmitz, J. & Hueting, R. J. E., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures (ICMTS 2013). USA: IEEE, p. 115-120 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Conduction and electric field effect in ultra-thin TiN films

Van Hao, B., Kovalgin, A. Y., Schmitz, J. & Wolters, R. A. M., 31 Jul 2013, In : Applied physics letters. 103, 5, p. 051904 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

12 Citations (Scopus)
1 Downloads (Pure)

Deep reactive ion etching of in situ boron doped LPCVD Ge0.7Si0.3 using SF6 and O2 plasma

Kazmi, S. N. R., Salm, C. & Schmitz, J., Oct 2013, In : Microelectronic engineering. 110, p. 311-314 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Degradation and reliability of silicon power transistors

Schmitz, J., Oct 2013, 2013 IEEE International Integrated Reliability Workshop Final Report.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Deposition and properties of silicon oxynitride films with low propagation losses by inductively coupled PECVD at 150 °C

Rangarajan, B., Kovalgin, A. Y. & Schmitz, J., 15 Sep 2013, In : Surface and coatings technology. 230, p. 46-50 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

GridPix detectors: production and beam test results

Koppert, W. J. C., van Bakel, N., Bilevych, Y., Bilevych, Y., Colas, P., Desch, K., Fransen, M., van der Graaf, H., Hartjes, F., Hessey, N. P., Kaminski, J., Schmitz, J., Schön, R. & Zappon, F., Dec 2013, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 732, p. 245-249 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Low-temperature deposition of high-quality siliconoxynitride films for CMOS-integrated optics

Rangarajan, B., Kovalgin, A. Y., Worhoff, K. & Schmitz, J., 13 Mar 2013, In : Optics letters. 38, 6, p. 941-943 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

15 Citations (Scopus)

Mechanical resonators on CMOS for integrated passive band pass filters

Kazmi, S. N. R., Salm, C. & Schmitz, J., 23 Jul 2013, ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'. p. 193-196 4 p. 6523517. (ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day').

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Microchip post-processing: There is plenty of room at the top

Schmitz, J., 1 Jan 2013, Future Trends in Microelectronics: Frontiers and Innovations. Luryi, S., Xu, J. & Zaslavsky, A. (eds.). Wiley, p. 110-119 10 p.

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

2 Citations (Scopus)

Role of junction depth in light emission from silicon p-i-n LEDs

Piccolo, G., Sammak, A., Hueting, R. J. E., Schmitz, J. & Nanver, L. K., 16 Sep 2013, Proceeding of European Solid State Device Research Conference (ESSDERC 2013). USA: IEEE, p. 119-122 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Strain and conduction-band offset in narrow n-type finFETs

van Hemert, T., Kaleli, B., Hueting, R. J. E., Esseni, D., van Dal, M. J. H. & Schmitz, J., 1 Mar 2013, In : IEEE transactions on electron devices. 60, 3, p. 1005-1010 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

The gridpix detector: History and perspective

van der Graaf, H., Aarnink, A. A. I., Aarts, A., van Bakel, N., Berbee, E., Berkien, A., van Beuzekom, M., Bosma, M., Campbell, M., Chefdeville, M. A., Colas, P., Colijn, A. P., Fomaini, A., Fransen, M., Giganon, A., Giomataris, I., Gotink, W., de Groot, N., Hartjes, F., van der Heijden, B. & 18 others, Hessey, N., Jansweijer, P., Konig, A., Koppert, W., Llopart, X., de Nooij, L., van der Putten, S., Rövekamp, J., Salm, C., San Segundo Bello, D., Schmitz, J., Smits, S. M., Timmermans, J., Verkooijen, H., Visschers, J., Visser, J., Wijnen, T. & Wyrsch, N., 24 Apr 2013, In : Modern physics letters. A. 28, 28-13, p. 13400211-13400217 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)