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  • 2020
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  • Lis Karen Nanver
2020

Broadband PureGaB Ge-on-Si photodiodes responsive in the ultraviolet to near-infrared range

Knezević, T., Krakers, M. & Nanver, L. K., 3 Mar 2020, Optical Components and Materials XVII. Jiang, S. & Digonnet, M. J. F. (eds.). SPIE Press, 112760I. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 11276).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Diode design for studying material defect distributions with avalanche-mode light emission

Krakers, M., Knezevic, T., Batenburg, K. M., Liu, X. & Nanver, L. K., May 2020, 2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020 - Proceedings. Piscataway, NJ: IEEE, 9107933. (IEEE International Conference on Microelectronic Test Structures; vol. 2020).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2019

Back-end-of-line CMOS-compatible diode fabrication with pure boron deposition down to 50 °C

Knežević, T., Suligoj, T., Liu, X., Nanver, L. K., Elsayed, A., Dick, J. F. & Schulze, J., 1 Sep 2019, ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC). IEEE, p. 242-245 4 p. 8901810. (European Solid-State Device Research Conference; vol. 2019-September).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers

Kneževic, T., Suligoj, T. & Nanver, L. K., 1 May 2019, 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. Skala, K., Car, Z., Pale, P., Huljenic, D., Janjic, M., Koricic, M., Sruk, V., Ribaric, S., Grbac, T. G., Butkovic, Z., Cicin-Sain, M., Skvorc, D., Mauher, M., Babic, S., Gros, S., Vrdoljak, B. & Tijan, E. (eds.). IEEE, p. 24-29 6 p. 8757156. (International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO); vol. 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures

Gupta, G., Tharnmaiah, S. D., Hueting, R. J. E. & Nanver, L. K., 6 Jun 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 12-17 6 p. 8730920

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

Limits on Thinning of Boron Layers With/Without Metal Contacting in PureB Si (Photo)Diodes

Knezevic, T., Liu, X., Hardeveld, E., Suligoj, T. & Nanver, L. K., 1 Jun 2019, In : IEEE electron device letters. 40, 6, p. 858-861 4 p., 8686173.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)
4 Downloads (Pure)

Minimization of dark counts in PureB SPADs for NUV/VUV/EUV light detection by employing a 2D TCAD-based simulation environment

Knežević, T., Nanver, L. K. & Suligoj, T., 26 Feb 2019, Physics and Simulation of Optoelectronic Devices XXVII. Osinski, M., Witzigmann, B. & Arakawa, Y. (eds.). SPIE, Vol. 10912. 109120Y. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10912).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
46 Downloads (Pure)

Nanometer-thin pure B layers Grown by MBE as metal diffusion barrier on GaN Diodes

Thammaiah, S. D., Hansen, J. L. & Nanver, L. K., 1 Mar 2019, China Semiconductor Technology International Conference 2019, CSTIC 2019. Claeys, C., Huang, R., Wu, H., Lin, Q., Liang, S., Song, P., Guo, Z., Lai, K., Zhang, Y., Qu, X., Lung, H-L. & Yu, W. (eds.). Piscataway, NJ: IEEE, 8755633

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

Reverse breakdown and light-emission patterns studied in Si PureB SPADs

Krakers, M., Kneževic, T. & Nanver, L. K., 1 May 2019, 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. Skala, K., Car, Z., Pale, P., Huljenic, D., Janjic, M., Koricic, M., Sruk, V., Ribaric, S., Grbac, T. G., Butkovic, Z., Cicin-Sain, M., Skvorc, D., Mauher, M., Babic, S., Gros, S., Vrdoljak, B. & Tijan, E. (eds.). Piscataway, NJ: IEEE, p. 30-35 6 p. 8757007. (International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO); vol. 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Silicon micromachining with nanometer-thin boron masking and membrane material

Liu, X., Italiano, J., Scott, R. & Nanver, L. K., 18 Oct 2019, In : Materials Research Express. 6, 11, 116438.

Research output: Contribution to journalArticleAcademicpeer-review

1 Downloads (Pure)
2018

2D Dark-Count-Rate Modeling of PureB Single-Photon Avalanche Diodes in a TCAD Environment

Knežević, T., Nanver, L. K. & Suligoj, T., 23 Feb 2018, Physics and Simulation of Optoelectronic Devices XXVI: SPIE OPTO, 27 January - 1 February 2018, San Francisco, California, United States. Witzigmann, B., Osiński, M. & Arakawa, Y. (eds.). Bellingham, WA: SPIE, 10 p. 105261K. (Proceedings of SPIE; vol. 10526).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
3 Downloads (Pure)

An experimental view on PureB silicon photodiode device physics

Nanver, L. K., 28 Jun 2018, 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings. IEEE, 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
2 Downloads (Pure)

Data Transmission Capabilities of Silicon Avalanche Mode Light-Emitting Diodes

Agarwal, V., Annema, A-J., Hueting, R. J. E., Dutta, S., Nanver, L. K. & Nauta, B., 1 Nov 2018, In : IEEE transactions on electron devices. 65, 11, p. 4883-4890 8 p., 8472882.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
4 Citations (Scopus)
57 Downloads (Pure)

Indirect optical crosstalk reduction by highly-doped backside layer in single-photon avalanche diode arrays

Osrečki, Ž., Knežević, T., Nanver, L. K. & Suligoj, T., 1 Mar 2018, In : Optical and quantum electronics. 50, 3, 152.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Investigation of light-emission and avalanche-current mechanisms in PureB SPAD devices

Nanver, L. K., Krakers, M., Knezevic, T., Karavidas, A., Boturchuk, I., Agarwal, V., Hueting, R. J. E., Dutta, S. & Annema, A. J., 8 Oct 2018, Fifth Conference on Sensors, MEMS and Electro-Optical Systems 2018. SPIE International, Vol. 11043.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
2 Downloads (Pure)

Material Reliability of Low-Temperature Boron Deposition for PureB Silicon Photodiode Fabrication

Nanver, L. K., Lyon, K., Liu, X., Italiano, J. & Huffman, J., 26 Jun 2018, In : MRS Advances. 3, 57-58, p. 3397-3402 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
6 Downloads (Pure)

Non-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures

Knezevic, T., Nanver, L. K., Capan, I. & Suligoj, T., 28 Jun 2018, 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings. IEEE, p. 12-17 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Random telegraph signal phenomena in ultra shallow p+n silicon avalanche diodes

Agarwal, V., Annema, A. J., Dutta, S., Hueting, R. J. E., Nanver, L. K. & Nauta, B., 10 May 2018, In : Journal of the Electron Devices Society. 6, 1, p. 642-652 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
3 Citations (Scopus)
63 Downloads (Pure)

Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

Nanver, L. K., Liu, X. & Knežević, T., 2018, 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 69-74 6 p. (IEEE International Conference on Microelectronic Test Structures (ICMTS)).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

6 Citations (Scopus)
1 Downloads (Pure)
2017

Indirect optical crosstalk reduction by highly-doped backside layer in PureB single-photon avalanche diode arrays

Osrečki, Ž., Knežević, T., Nanver, L. K. & Suligoj, T., 11 Aug 2017, 17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017: 24-28 July 2017, Copenhagen, Denmark. IEEE Computer Society, p. 69-70 2 p. 8009995

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Nanometer-Thin Pure Boron Layers as Mask for Silicon Micromachining

Liu, X., Nanver, L. K. & Scholtes, T. L. M., Dec 2017, In : Journal of microelectromechanical systems. 26, 6, p. 1428-1434

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)
1 Downloads (Pure)

Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions

Knežević, T., Nanver, L. K. & Suligoj, T., 13 Jul 2017, 2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2017 - Proceedings. IEEE, p. 72-76 5 p. 7973393

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Thin-Film layers with Interfaces that reduce RF Losses on High-Resistivity Silicon Substrates

Evseev, S. B., Milosavljevic, S. & Nanver, L. K., 15 Nov 2017, 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, BCTM 2017. IEEE, Vol. 2017-October. p. 21-24 4 p. 8112903

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)
2016

CMOS-compatible PureGaB Ge-on-Si APD pixel arrays

Sammak, A., Aminian, M., Nanver, L. K. & Charbon, E., 1 Jan 2016, In : IEEE transactions on electron devices. 63, 1, p. 92-99 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
6 Citations (Scopus)
63 Downloads (Pure)

Comparing current flows in ultrashallow pn-/Schottky-like diodes with 2-diode test method

Liu, X. & Nanver, L. K., 28 Mar 2016, Microelectronic Test Structures (ICMTS), 2016 International Conference on. New York: IEEE, p. 190-195 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
1 Downloads (Pure)

Random telegraph signal phenomena in avalanche mode diodes: application to SPADs

Agarwal, V. V., Annema, A. J., Dutta, S., Hueting, R. J. E., Nanver, L. K. & Nauta, B., 14 Sep 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC). USA: IEEE, p. 264-267 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
2 Citations (Scopus)
111 Downloads (Pure)

Silicon drift detectors with the drift field induced by pureB-coated trenches

Nanver, L. K., Kneževi´c, T. & Suligoj, T., 29 Oct 2016, In : Photonics. 3, 54, p. 1-18 18 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
4 Citations (Scopus)
37 Downloads (Pure)