A 16-bit D/A interface with Sinc approximated semidigital reconstruction filter and reduced number of coefficients

M.A.T. Sanduleanu, Adrianus Johannes Maria van Tuijl, R.F. Wassenaar, Hans Wallinga

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Abstract

    Due to components nonidealities, the analog reconstruction is the most difficult analog building block in a D/A converter. The paper presents a 16-bit D/A interface with a current driven semidigital filter and reduced number of coefficients. To optimise the number of coefficients an iterative method based on Sinc approximation has been used. With only 25 coefficients we get more than 50dB stopband rejection of noise. A differential solution is proposed to reduce the digital crosstalk and to increase the output swing. The D/A interface has been realised on chip in a 0.8µm CMOS 5V technology. S/N+THD measurements are provided.
    Original languageEnglish
    Title of host publicationProceedings of the 24th European Solid-State Circuits Conference
    Place of PublicationPiscataway, NJ, USA
    PublisherIEEE
    Pages176-179
    Number of pages4
    ISBN (Print)2-86332-235-4
    DOIs
    Publication statusPublished - 30 Sep 1998
    Event24th European Solid-State Circuits Conference, ESSCIRC 1998 - The Hague, Netherlands
    Duration: 22 Sep 199824 Sep 1998
    Conference number: 24

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference24th European Solid-State Circuits Conference, ESSCIRC 1998
    Abbreviated titleESSCIRC
    CountryNetherlands
    CityThe Hague
    Period22/09/9824/09/98

      Fingerprint

    Keywords

    • METIS-112910
    • IR-16028

    Cite this

    Sanduleanu, M. A. T., van Tuijl, A. J. M., Wassenaar, R. F., & Wallinga, H. (1998). A 16-bit D/A interface with Sinc approximated semidigital reconstruction filter and reduced number of coefficients. In Proceedings of the 24th European Solid-State Circuits Conference (pp. 176-179). Piscataway, NJ, USA: IEEE. https://doi.org/10.1109/ESSCIR.1998.186238