Abstract
For the first time, a temperature-compensated CMOS frequency reference based on the electron mobility in a MOS transistor is presented. Over the temperature range from -55°C to 125 °C, its frequency spread is less than ±0.5% after a two-point trim and less than ±2.7% after a one-point trim. These results make it suitable for use in Wireless Sensor Network nodes. Fabricated in a baseline 65-nm CMOS process, the 150 kHz frequency reference occupies 0.2 mm2 and draws 42.6 μA from a 1.2-V supply at room temperature.
Original language | English |
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Title of host publication | Proceedings of the ESSCIRC 2010 |
Place of Publication | Piscataway |
Publisher | IEEE |
Pages | 102-105 |
Number of pages | 4 |
ISBN (Print) | 978-1-4244-6662-7 |
DOIs | |
Publication status | Published - 13 Sept 2010 |
Event | 36th European Solid-State Circuits Conference, ESSCIRC 2010 - Hotel Barcel Renacimiento, Sevilla, Spain Duration: 14 Sept 2010 → 16 Sept 2010 Conference number: 36 |
Conference
Conference | 36th European Solid-State Circuits Conference, ESSCIRC 2010 |
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Abbreviated title | ESSCIRC |
Country/Territory | Spain |
City | Sevilla |
Period | 14/09/10 → 16/09/10 |
Keywords
- METIS-275726
- EWI-18908
- IR-75698