A CMOS compatible Ge-on-Si APD operating in proportional and Geiger modes at infrared wavelengths

Earth and Planetary Sciences

• CMOS 100%
• Wavelength 100%
• Avalanche 100%
• Thickness 50%
• Growth 50%
• Deposition 50%
• Temperature 50%
• Region 50%
• Sensitivity 50%
• Island 50%
• Single Crystal 50%
• Good 50%
• Show 50%
• Size 50%

Engineering

• Wavelength 100%
• Ideality Factor 50%
• High Sensitivity 50%
• Windows 50%
• Measurement 50%
• Temperature 50%
• Layer Thickness 50%
• Characteristics 50%
• Avalanche Photodiode 50%

Physics

• Avalanche 100%
• Growth 50%
• Temperature 50%
• Region 50%
• Deposition 50%
• Island 50%
• Single Crystals 50%