A combined optical and magneto-optical measurement system

W.J.M.A. Geerts, J.C. Lodder, Th.J.A. Popma

    Research output: Contribution to journalArticleAcademicpeer-review

    2 Citations (Scopus)

    Abstract

    A magneto‐optical (MO) Kerr tracer based on an ellipsometer was developed for studying the surface magnetic properties of thin films. This system can be used to measure the optical properties n and k, which are strongly related to the magneto‐optical parameters θk and ηk. In order to carry out measurements on materials having a small θk we have developed a multiple reflection sample holder which gives an enhancement of the rotation. The behavior of the sample holder is explained in terms of Jones matrices. The optical and magneto‐optical properties for a thickness series of Co‐Cr films were measured. Comparative measurements on other systems gave similar results.
    Original languageEnglish
    Pages (from-to)1805-1809
    Number of pages5
    JournalReview of scientific instruments
    Volume63
    Issue number2
    DOIs
    Publication statusPublished - 1992

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