A combined optical and magneto-optical measurement system

W.J.M.A. Geerts; J.C. Lodder; Th.J.A. Popma

doi:10.1063/1.1143341

A combined optical and magneto-optical measurement system

W.J.M.A. Geerts
, J.C. Lodder
, Th.J.A. Popma

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

A magneto‐optical (MO) Kerr tracer based on an ellipsometer was developed for studying the surface magnetic properties of thin films. This system can be used to measure the optical properties n and k, which are strongly related to the magneto‐optical parameters θ_k and η_k. In order to carry out measurements on materials having a small θk we have developed a multiple reflection sample holder which gives an enhancement of the rotation. The behavior of the sample holder is explained in terms of Jones matrices. The optical and magneto‐optical properties for a thickness series of Co‐Cr films were measured. Comparative measurements on other systems gave similar results.

Original language	English
Pages (from-to)	1805-1809
Number of pages	5
Journal	Review of scientific instruments
Volume	63
Issue number	2
DOIs	https://doi.org/10.1063/1.1143341
Publication status	Published - 1992

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AB - A magneto‐optical (MO) Kerr tracer based on an ellipsometer was developed for studying the surface magnetic properties of thin films. This system can be used to measure the optical properties n and k, which are strongly related to the magneto‐optical parameters θk and ηk. In order to carry out measurements on materials having a small θk we have developed a multiple reflection sample holder which gives an enhancement of the rotation. The behavior of the sample holder is explained in terms of Jones matrices. The optical and magneto‐optical properties for a thickness series of Co‐Cr films were measured. Comparative measurements on other systems gave similar results.

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DO - 10.1063/1.1143341

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JO - Review of scientific instruments

JF - Review of scientific instruments

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ER -

A combined optical and magneto-optical measurement system

Abstract

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