A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features

Raymond N.J. Veldhuis, A.M. Bazen, Wim Booij, A.J. Hendrikse, Anne Hendrikse

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    Abstract

    This paper compares the performance of hand-geometry recognition based on high-level features and on low-level features. The difference between high- and low-level features is that the former are based on interpreting the biometric data, e.g. by locating a finger and measuring its dimensions, whereas the latter are not. The low-level features used here are landmarks on the contour of the hand. The high-level features are a standard set of geometrical features such as widths and lengths of fingers and angles, measured at preselected locations.
    Original languageUndefined
    Title of host publication15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC)
    Place of PublicationUtrecht, The Netherlands
    PublisherSTW
    Pages326-330
    Number of pages5
    ISBN (Print)90-73461-43-X
    Publication statusPublished - Nov 2004
    Event15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands
    Duration: 25 Nov 200426 Nov 2004
    Conference number: 15

    Publication series

    Name
    PublisherSTW/NWO/Dutch Ministry of Economic Affairs

    Conference

    Conference15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004
    Abbreviated titleProRisc
    CountryNetherlands
    CityVeldhoven
    Period25/11/0426/11/04

    Keywords

    • Landmarks
    • Hand geometry
    • EWI-788
    • SCS-Safety
    • hand contour
    • Biometric verification
    • IR-48121
    • METIS-219316

    Cite this

    Veldhuis, R. N. J., Bazen, A. M., Booij, W., Hendrikse, A. J., & Hendrikse, A. (2004). A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features. In 15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC) (pp. 326-330). Utrecht, The Netherlands: STW.