This paper compares the performance of hand-geometry recognition based on high-level features and on low-level features. The difference between high- and low-level features is that the former are based on interpreting the biometric data, e.g. by locating a finger and measuring its dimensions, whereas the latter are not. The low-level features used here are landmarks on the contour of the hand. The high-level features are a standard set of geometrical features such as widths and lengths of fingers and angles, measured at preselected locations.
|Title of host publication||15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC)|
|Place of Publication||Utrecht, The Netherlands|
|Number of pages||5|
|Publication status||Published - Nov 2004|
|Event||15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands|
Duration: 25 Nov 2004 → 26 Nov 2004
Conference number: 15
|Publisher||STW/NWO/Dutch Ministry of Economic Affairs|
|Conference||15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004|
|Period||25/11/04 → 26/11/04|
- Hand geometry
- hand contour
- Biometric verification
Veldhuis, R. N. J., Bazen, A. M., Booij, W., Hendrikse, A. J., & Hendrikse, A. (2004). A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features. In 15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC) (pp. 326-330). Utrecht, The Netherlands: STW.