A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features

Raymond N.J. Veldhuis, A.M. Bazen, Wim Booij, A.J. Hendrikse, Anne Hendrikse

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

This paper compares the performance of hand-geometry recognition based on high-level features and on low-level features. The difference between high- and low-level features is that the former are based on interpreting the biometric data, e.g. by locating a finger and measuring its dimensions, whereas the latter are not. The low-level features used here are landmarks on the contour of the hand. The high-level features are a standard set of geometrical features such as widths and lengths of fingers and angles, measured at preselected locations.
Original languageUndefined
Title of host publication15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC)
Place of PublicationUtrecht, The Netherlands
PublisherSTW
Pages326-330
Number of pages5
ISBN (Print)90-73461-43-X
Publication statusPublished - Nov 2004
Event15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands
Duration: 25 Nov 200426 Nov 2004
Conference number: 15

Publication series

Name
PublisherSTW/NWO/Dutch Ministry of Economic Affairs

Conference

Conference15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004
Abbreviated titleProRisc
CountryNetherlands
CityVeldhoven
Period25/11/0426/11/04

Keywords

  • Landmarks
  • Hand geometry
  • EWI-788
  • SCS-Safety
  • hand contour
  • Biometric verification
  • IR-48121
  • METIS-219316

Cite this

Veldhuis, R. N. J., Bazen, A. M., Booij, W., Hendrikse, A. J., & Hendrikse, A. (2004). A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features. In 15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC) (pp. 326-330). Utrecht, The Netherlands: STW.
Veldhuis, Raymond N.J. ; Bazen, A.M. ; Booij, Wim ; Hendrikse, A.J. ; Hendrikse, Anne. / A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features. 15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC). Utrecht, The Netherlands : STW, 2004. pp. 326-330
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title = "A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features",
abstract = "This paper compares the performance of hand-geometry recognition based on high-level features and on low-level features. The difference between high- and low-level features is that the former are based on interpreting the biometric data, e.g. by locating a finger and measuring its dimensions, whereas the latter are not. The low-level features used here are landmarks on the contour of the hand. The high-level features are a standard set of geometrical features such as widths and lengths of fingers and angles, measured at preselected locations.",
keywords = "Landmarks, Hand geometry, EWI-788, SCS-Safety, hand contour, Biometric verification, IR-48121, METIS-219316",
author = "Veldhuis, {Raymond N.J.} and A.M. Bazen and Wim Booij and A.J. Hendrikse and Anne Hendrikse",
note = "Imported from DIES",
year = "2004",
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language = "Undefined",
isbn = "90-73461-43-X",
publisher = "STW",
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Veldhuis, RNJ, Bazen, AM, Booij, W, Hendrikse, AJ & Hendrikse, A 2004, A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features. in 15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC). STW, Utrecht, The Netherlands, pp. 326-330, 15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004, Veldhoven, Netherlands, 25/11/04.

A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features. / Veldhuis, Raymond N.J.; Bazen, A.M.; Booij, Wim; Hendrikse, A.J.; Hendrikse, Anne.

15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC). Utrecht, The Netherlands : STW, 2004. p. 326-330.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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AU - Hendrikse, Anne

N1 - Imported from DIES

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N2 - This paper compares the performance of hand-geometry recognition based on high-level features and on low-level features. The difference between high- and low-level features is that the former are based on interpreting the biometric data, e.g. by locating a finger and measuring its dimensions, whereas the latter are not. The low-level features used here are landmarks on the contour of the hand. The high-level features are a standard set of geometrical features such as widths and lengths of fingers and angles, measured at preselected locations.

AB - This paper compares the performance of hand-geometry recognition based on high-level features and on low-level features. The difference between high- and low-level features is that the former are based on interpreting the biometric data, e.g. by locating a finger and measuring its dimensions, whereas the latter are not. The low-level features used here are landmarks on the contour of the hand. The high-level features are a standard set of geometrical features such as widths and lengths of fingers and angles, measured at preselected locations.

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KW - Hand geometry

KW - EWI-788

KW - SCS-Safety

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BT - 15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC)

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Veldhuis RNJ, Bazen AM, Booij W, Hendrikse AJ, Hendrikse A. A Comparison of Hand-Geometry Recognition Methods Based on Low- and High-Level Features. In 15th Annual Workshop on Circuits Systems and Signal Processing (ProRISC). Utrecht, The Netherlands: STW. 2004. p. 326-330