Abstract
| Original language | Undefined |
|---|---|
| Pages (from-to) | 433-435 |
| Journal | Acta crystallographica Section A: Crystal physics, diffraction, theoretical and general crystallography |
| Volume | 36 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1980 |
Keywords
- IR-59205
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A correction procedure for the errors in single-crystal intensities due to the inhomogeneity of the primary X-ray beam. / Harkema, Sybolt; Dam, J.; van Hummel, G.J.; Reuvers, A.J.
In: Acta crystallographica Section A: Crystal physics, diffraction, theoretical and general crystallography, Vol. 36, No. 3, 1980, p. 433-435.Research output: Contribution to journal › Article › Academic
TY - JOUR
T1 - A correction procedure for the errors in single-crystal intensities due to the inhomogeneity of the primary X-ray beam
AU - Harkema, Sybolt
AU - Dam, J.
AU - van Hummel, G.J.
AU - Reuvers, A.J.
PY - 1980
Y1 - 1980
N2 - Graphite monochromators are known to give rise to non-homogeneous primary X-ray beams. When intensities of single crystals are measured the effective cross section of a non-spherical crystal in the X-ray beam depends on its orientation in the beam. Therefore, systematic errors in the measured integrated intensities are introduced by the inhomogeneity of the incoming beam. A correction for these errors can be made, knowing the intensity profile of the primary beam and the dimensions and orientation of the crystal in the beam. The correction can conveniently be applied with the absorption correction. Examples of the corrections are given for crystals with rational boundary planes. It is shown that the intensity of an X-ray reflection as a function of the rotation about the scattering vector ( rotation) can be calculated with fair accuracy. In some cases (large elongated crystals in an inhomogeneous beam) correction for absorption only may give results which are worse than those with no correction at all.
AB - Graphite monochromators are known to give rise to non-homogeneous primary X-ray beams. When intensities of single crystals are measured the effective cross section of a non-spherical crystal in the X-ray beam depends on its orientation in the beam. Therefore, systematic errors in the measured integrated intensities are introduced by the inhomogeneity of the incoming beam. A correction for these errors can be made, knowing the intensity profile of the primary beam and the dimensions and orientation of the crystal in the beam. The correction can conveniently be applied with the absorption correction. Examples of the corrections are given for crystals with rational boundary planes. It is shown that the intensity of an X-ray reflection as a function of the rotation about the scattering vector ( rotation) can be calculated with fair accuracy. In some cases (large elongated crystals in an inhomogeneous beam) correction for absorption only may give results which are worse than those with no correction at all.
KW - IR-59205
U2 - 10.1107/S0567739480000939
DO - 10.1107/S0567739480000939
M3 - Article
VL - 36
SP - 433
EP - 435
JO - Acta crystallographica Section A: Foundations of crystallography
JF - Acta crystallographica Section A: Foundations of crystallography
SN - 0108-7673
IS - 3
ER -