A cost analysis study for testability purposes on silicon active substrates

J. Oliver, Hans G. Kerkhoff

Research output: Contribution to journal › Article › Academic › peer-review

Original language	Undefined
Pages (from-to)	179-186
Journal	IEEE transactions on components, packaging and manufacturing technology, part A
Volume	19
Issue number	2
Publication status	Published - 1996

Keywords

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title = "A cost analysis study for testability purposes on silicon active substrates",

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author = "J. Oliver and Kerkhoff, {Hans G.}",

year = "1996",

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journal = "IEEE transactions on components, packaging and manufacturing technology, part A",

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TY - JOUR

T1 - A cost analysis study for testability purposes on silicon active substrates

AU - Oliver, J.

AU - Kerkhoff, Hans G.

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Y1 - 1996

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SP - 179

EP - 186

JO - IEEE transactions on components, packaging and manufacturing technology, part A

JF - IEEE transactions on components, packaging and manufacturing technology, part A

SN - 1070-9886

IS - 2

ER -