A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687

Ahmed Mohammed Youssef Ibrahim, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)
    2 Downloads (Pure)

    Abstract

    A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.
    Original languageEnglish
    Title of host publication 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)
    PublisherIEEE
    Pages1-2
    Number of pages2
    ISBN (Electronic)978-1-5386-0352-9
    ISBN (Print)978-1-5386-0351-2
    DOIs
    Publication statusPublished - 3 Jul 2017
    Event23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017 - Hotel Makedonia Palace, Thessaloniki, Greece
    Duration: 3 Jul 20175 Jul 2017
    Conference number: 23
    http://ieee-ceda.org/event/23rd-ieee-international-symposium-line-testing-and-robust-system-design

    Conference

    Conference23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017
    Abbreviated titleIOLTS 2017
    CountryGreece
    CityThessaloniki
    Period3/07/175/07/17
    Internet address

    Fingerprint

    Costs
    Actuators
    Communication
    Sensors
    System-on-chip

    Cite this

    Ibrahim, A. M. Y., & Kerkhoff, H. G. (2017). A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. In 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (pp. 1-2). IEEE. https://doi.org/10.1109/IOLTS.2017.8046166
    Ibrahim, Ahmed Mohammed Youssef ; Kerkhoff, Hans G. / A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, 2017. pp. 1-2
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    title = "A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687",
    abstract = "A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.",
    author = "Ibrahim, {Ahmed Mohammed Youssef} and Kerkhoff, {Hans G.}",
    year = "2017",
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    booktitle = "2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)",
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    Ibrahim, AMY & Kerkhoff, HG 2017, A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. in 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, pp. 1-2, 23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017, Thessaloniki, Greece, 3/07/17. https://doi.org/10.1109/IOLTS.2017.8046166

    A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. / Ibrahim, Ahmed Mohammed Youssef; Kerkhoff, Hans G.

    2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, 2017. p. 1-2.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    Ibrahim AMY, Kerkhoff HG. A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. In 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE. 2017. p. 1-2 https://doi.org/10.1109/IOLTS.2017.8046166