Abstract
| Original language | English |
|---|---|
| Title of host publication | 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) |
| Publisher | IEEE |
| Pages | 1-2 |
| Number of pages | 2 |
| ISBN (Electronic) | 978-1-5386-0352-9 |
| ISBN (Print) | 978-1-5386-0351-2 |
| DOIs | |
| Publication status | Published - 3 Jul 2017 |
| Event | 23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017 - Hotel Makedonia Palace, Thessaloniki, Greece Duration: 3 Jul 2017 → 5 Jul 2017 Conference number: 23 http://ieee-ceda.org/event/23rd-ieee-international-symposium-line-testing-and-robust-system-design |
Conference
| Conference | 23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017 |
|---|---|
| Abbreviated title | IOLTS 2017 |
| Country | Greece |
| City | Thessaloniki |
| Period | 3/07/17 → 5/07/17 |
| Internet address |
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A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. / Ibrahim, Ahmed Mohammed Youssef; Kerkhoff, Hans G.
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, 2017. p. 1-2.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
TY - GEN
T1 - A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687
AU - Ibrahim, Ahmed Mohammed Youssef
AU - Kerkhoff, Hans G.
PY - 2017/7/3
Y1 - 2017/7/3
N2 - A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.
AB - A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.
U2 - 10.1109/IOLTS.2017.8046166
DO - 10.1109/IOLTS.2017.8046166
M3 - Conference contribution
SN - 978-1-5386-0351-2
SP - 1
EP - 2
BT - 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)
PB - IEEE
ER -