Abstract
A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.
Original language | English |
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Title of host publication | 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) |
Publisher | IEEE |
Pages | 1-2 |
Number of pages | 2 |
ISBN (Electronic) | 978-1-5386-0352-9 |
ISBN (Print) | 978-1-5386-0351-2 |
DOIs | |
Publication status | Published - 3 Jul 2017 |
Event | 23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017 - Hotel Makedonia Palace, Thessaloniki, Greece Duration: 3 Jul 2017 → 5 Jul 2017 Conference number: 23 http://ieee-ceda.org/event/23rd-ieee-international-symposium-line-testing-and-robust-system-design |
Conference
Conference | 23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017 |
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Abbreviated title | IOLTS 2017 |
Country/Territory | Greece |
City | Thessaloniki |
Period | 3/07/17 → 5/07/17 |
Internet address |