A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687

Ahmed Mohammed Youssef Ibrahim, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)
    2 Downloads (Pure)

    Abstract

    A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.
    Original languageEnglish
    Title of host publication 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)
    PublisherIEEE
    Pages1-2
    Number of pages2
    ISBN (Electronic)978-1-5386-0352-9
    ISBN (Print)978-1-5386-0351-2
    DOIs
    Publication statusPublished - 3 Jul 2017
    Event23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017 - Hotel Makedonia Palace, Thessaloniki, Greece
    Duration: 3 Jul 20175 Jul 2017
    Conference number: 23
    http://ieee-ceda.org/event/23rd-ieee-international-symposium-line-testing-and-robust-system-design

    Conference

    Conference23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017
    Abbreviated titleIOLTS 2017
    CountryGreece
    CityThessaloniki
    Period3/07/175/07/17
    Internet address

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  • Cite this

    Ibrahim, A. M. Y., & Kerkhoff, H. G. (2017). A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. In 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (pp. 1-2). IEEE. https://doi.org/10.1109/IOLTS.2017.8046166