A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687

Ahmed Mohammed Youssef Ibrahim; Hans G. Kerkhoff

doi:10.1109/IOLTS.2017.8046166

A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687

Ahmed Mohammed Youssef Ibrahim
, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)

15 Downloads (Pure)

Abstract

A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.

Original language	English
Title of host publication	2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Publisher	IEEE
Pages	1-2
Number of pages	2
ISBN (Electronic)	978-1-5386-0352-9
ISBN (Print)	978-1-5386-0351-2
DOIs	https://doi.org/10.1109/IOLTS.2017.8046166
Publication status	Published - 3 Jul 2017
Event	23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017 - Hotel Makedonia Palace, Thessaloniki, Greece Duration: 3 Jul 2017 → 5 Jul 2017 Conference number: 23 http://ieee-ceda.org/event/23rd-ieee-international-symposium-line-testing-and-robust-system-design

Conference

Conference	23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017
Abbreviated title	IOLTS 2017
Country/Territory	Greece
City	Thessaloniki
Period	3/07/17 → 5/07/17
Internet address	http://ieee-ceda.org/event/23rd-ieee-international-symposium-line-testing-and-robust-system-design

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10.1109/IOLTS.2017.8046166

Cite this

@inproceedings{fb9211d441694e30a99ce0712c7ed272,

title = "A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687",

abstract = "A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.",

author = "Ibrahim, \{Ahmed Mohammed Youssef\} and Kerkhoff, \{Hans G.\}",

year = "2017",

month = jul,

day = "3",

doi = "10.1109/IOLTS.2017.8046166",

language = "English",

isbn = "978-1-5386-0351-2",

pages = "1--2",

booktitle = "2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)",

publisher = "IEEE",

address = "United States",

note = "23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017, IOLTS 2017 ; Conference date: 03-07-2017 Through 05-07-2017",

url = "http://ieee-ceda.org/event/23rd-ieee-international-symposium-line-testing-and-robust-system-design",

}

Ibrahim, AMY & Kerkhoff, HG 2017, A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. in 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, pp. 1-2, 23rd IEEE International Symposium on On-Line Testing and Robust System Design 2017, Thessaloniki, Greece, 3/07/17. https://doi.org/10.1109/IOLTS.2017.8046166

A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. / Ibrahim, Ahmed Mohammed Youssef; Kerkhoff, Hans G.
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, 2017. p. 1-2.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AB - A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.

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DO - 10.1109/IOLTS.2017.8046166

M3 - Conference contribution

SN - 978-1-5386-0351-2

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BT - 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)

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Y2 - 3 July 2017 through 5 July 2017

ER -

A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687

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