A Current Testing Method for Dynamic Logic Circuits

R. Rosing, Hans G. Kerkhoff, A. Acosta

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the IEEE International Workshop on IDDQ Testing (IDDQ'98)
Place of Publication	San Jose CA, USA
Pages	221-226
Number of pages	5
Publication status	Published - 1 Nov 1998

Keywords

@inproceedings{a0615bd4b43c433a89b1cd17b2774d17,

title = "A Current Testing Method for Dynamic Logic Circuits",

keywords = "METIS-112991",

author = "R. Rosing and Kerkhoff, {Hans G.} and A. Acosta",

year = "1998",

month = nov,

day = "1",

language = "Undefined",

pages = "221--226",

booktitle = "Proceedings of the IEEE International Workshop on IDDQ Testing (IDDQ'98)",

}