A Current Testing Method for Dynamic Logic Circuits

R. Rosing, Hans G. Kerkhoff, A. Acosta

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE International Workshop on IDDQ Testing (IDDQ'98)
    Place of PublicationSan Jose CA, USA
    Pages221-226
    Number of pages5
    Publication statusPublished - 1 Nov 1998

    Keywords

    • METIS-112991

    Cite this

    Rosing, R., Kerkhoff, H. G., & Acosta, A. (1998). A Current Testing Method for Dynamic Logic Circuits. In Proceedings of the IEEE International Workshop on IDDQ Testing (IDDQ'98) (pp. 221-226). San Jose CA, USA.