A Current Testing Method for Dynamic Logic Circuits

R. Rosing, Hans G. Kerkhoff, A. Acosta

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE International Workshop on IDDQ Testing (IDDQ'98)
    Place of PublicationSan Jose CA, USA
    Number of pages5
    Publication statusPublished - 1 Nov 1998


    • METIS-112991

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