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A Deep Side-View to Side-View Face Recognition System

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

Pose variation in unconstrained settings challenges face recognition, especially for side-view poses, which are affected by asymmetry, self-occlusion, and limited facial features. While deep learning has improved extreme pose handling, most methods focus on frontalization, with datasets favoring frontal views. As a result, generalization remains a challenge, with side-view poses facing difficulties in detection, alignment, and feature extraction, an issue often overlooked in the literature. This study addresses the unique challenges of side-view-to-side-view recognition. We build a recognition system leveraging transfer learning to achieve promising performance on the CMU Multi-PIE and UT-Door datasets. Next, we conduct cross-dataset evaluations, comparing deep features with Local Binary Patterns (LBP), an untrained algorithm. Results show that LBP exhibits strong robustness to cross-dataset variations and can outperform deep learning-based methods, underscoring the ongoing limitations in generalization.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE International Workshop on Biometrics And Forensics, IWBF 2025
EditorsAna Filipa Sequeira, Kiran Raja
PublisherIEEE
Number of pages6
ISBN (Electronic)979-8-3315-3715-9
DOIs
Publication statusPublished - 25 Aug 2025
Event13th IEEE International Workshop on Biometrics And Forensics, IWBF 2025 - UniCasino Universität der Bundeswehr München, Munich, Germany
Duration: 24 Apr 2025 → 25 Apr 2025
Conference number: 13

Conference

Conference13th IEEE International Workshop on Biometrics And Forensics, IWBF 2025
Abbreviated titleIWBF 2025
Country/TerritoryGermany
CityMunich
Period24/04/25 → 25/04/25

Keywords

  • 2026 OA procedure
  • Face Recognition
  • Image Processing
  • Side-view
  • Transfer Learning
  • Deep Learning

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