Abstract
Pose variation in unconstrained settings challenges face recognition, especially for side-view poses, which are affected by asymmetry, self-occlusion, and limited facial features. While deep learning has improved extreme pose handling, most methods focus on frontalization, with datasets favoring frontal views. As a result, generalization remains a challenge, with side-view poses facing difficulties in detection, alignment, and feature extraction, an issue often overlooked in the literature. This study addresses the unique challenges of side-view-to-side-view recognition. We build a recognition system leveraging transfer learning to achieve promising performance on the CMU Multi-PIE and UT-Door datasets. Next, we conduct cross-dataset evaluations, comparing deep features with Local Binary Patterns (LBP), an untrained algorithm. Results show that LBP exhibits strong robustness to cross-dataset variations and can outperform deep learning-based methods, underscoring the ongoing limitations in generalization.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2025 IEEE International Workshop on Biometrics And Forensics, IWBF 2025 |
| Editors | Ana Filipa Sequeira, Kiran Raja |
| Publisher | IEEE |
| Number of pages | 6 |
| ISBN (Electronic) | 979-8-3315-3715-9 |
| DOIs | |
| Publication status | Published - 25 Aug 2025 |
| Event | 13th IEEE International Workshop on Biometrics And Forensics, IWBF 2025 - UniCasino Universität der Bundeswehr München, Munich, Germany Duration: 24 Apr 2025 → 25 Apr 2025 Conference number: 13 |
Conference
| Conference | 13th IEEE International Workshop on Biometrics And Forensics, IWBF 2025 |
|---|---|
| Abbreviated title | IWBF 2025 |
| Country/Territory | Germany |
| City | Munich |
| Period | 24/04/25 → 25/04/25 |
Keywords
- 2026 OA procedure
- Face Recognition
- Image Processing
- Side-view
- Transfer Learning
- Deep Learning
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