A dependable AMR sensor system for automotive applications

A.C. Zambrano Constantini, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    7 Citations (Scopus)


    The increasing replacement of mechanical parts by x-by-wire systems in automotive applications allows improving driver safety. These systems demand highly dependable sensors that ensure their functionality despite the harsh operating conditions. This means that the sensors should be capable of working continuously despite catastrophic faults and keeping the performance over time. An anisotropic magnetoresistance (AMR) sensor is a magnetic sensor commonly used for angle measurements in cars. It is affected by catastrophic faults and performance degradation due to undesired parameters included at the sensor outputs. Until now, physical redundancy is often used to handle catastrophic faults. For the performance, compensation factors for the undesired parameter, such as offset voltage, are estimated at the start of the sensor life. Although the undesired parameters drift due to aging effects, the sensor performance remains within the allowed tolerant band. However, this tolerant band will decrease in the future because the dependability requirements are continuously increasing. Therefore, it is necessary to consider strategies to guarantee the sensor performance over time. This paper proposes a system to improve the sensor dependability using analytical redundancy for catastrophic faults but also with self-x properties to maintain the sensor performance over time. Results indicate a dependability improvement in terms of reliability, with a reduction of 50% in the rate of uncovered failures. The safety requirement ASIL level D is satisfied, and with regard to maintainability, the sensor performance is maintained over time.
    Original languageEnglish
    Title of host publication2017 International Test Conference in Asia (ITC-Asia)
    Number of pages6
    ISBN (Electronic)978-1-5386-3051-8
    Publication statusPublished - 7 Nov 2017
    Event2017 IEEE International Test Conference in Asia, ITC-Asia 2017 - TWTC Nangang Exhibition Hall, Taipei City, Taiwan
    Duration: 13 Sep 201715 Sep 2017


    Conference2017 IEEE International Test Conference in Asia, ITC-Asia 2017
    Abbreviated titleITC-Asia
    CityTaipei City
    Internet address


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