A Depth-Resolved Look at the Network Development of Alkyd Coatings by Atomic Force Microscopy and Confocal Raman Microscopy

B. Marton, L.G.J. van der Ven, Cornelis Otto, N. Uzunbajakava, Mark A. Hempenius, Gyula J. Vancso

Research output: Contribution to conferencePosterOther research output

Original languageUndefined
Pages-
Publication statusPublished - 15 Jul 2003
Event3rd International Conference on Scanning Probe Microscopy of Polymers, SPMP 2003 - Rolduc Abbey Conference Center, Kerkrade, Netherlands
Duration: 15 Jul 200318 Jul 2003
Conference number: 3

Conference

Conference3rd International Conference on Scanning Probe Microscopy of Polymers, SPMP 2003
Abbreviated titleSPMP
CountryNetherlands
CityKerkrade
Period15/07/0318/07/03

Keywords

  • METIS-213301

Cite this