A fast simulation technique for delay faults

Y. Xing, Hans G. Kerkhoff, G. van Brakel

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings IEEE/Prorisc symp. on circuits, systems and signal processing
    Place of PublicationVeldhoven
    Pages221-222
    Number of pages0
    Publication statusPublished - 3 Apr 1991

    Keywords

    • METIS-112961

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