A fault-tolerant solid state mass memory for highly reliable instrumentation

G.C. Cardarilli, M. Ottavi, S. Pontarelli, M. Re*, A. Salsano

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageUndefined
Title of host publicationProceedings of the 21st IEEE Instrumentation and Measurement Technology Conference
Subtitle of host publicationFrom the electrometer to the networked instruments: a giant step toward a deeper knowledgd
EditorsSerge Demidenko, Roberto Ottoboni, Dario Petri, Vincenzo Piuri, Dave Chong Tad Weng
PublisherIEEE
ISBN (Print)0-7803-8248-X
DOIs
Publication statusPublished - 8 Nov 2004
Externally publishedYes
Event21st IEEE Instrumentation and Measurement Technology Conference, IMTC 2004 - Como, Italy
Duration: 18 May 200420 May 2004

Publication series

Name
ISSN (Print)1091-5281

Conference

Conference21st IEEE Instrumentation and Measurement Technology Conference, IMTC 2004
Abbreviated titleIMTC 2004
Country/TerritoryItaly
CityComo
Period18/05/0420/05/04

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