A general weak nonlinearity model for LNAs

W. Cheng, Anne J. Annema, Jeroen A. Croon, Bram Nauta, Dirk B.M. Klaassen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    7 Citations (Scopus)
    51 Downloads (Pure)

    Abstract

    Abstract- This paper presents a general weak nonlinearity model that can be used to model, analyze and describe the distortion behavior of various low noise amplifier topologies in both narrowband and wideband applications. Represented by compact closed-form expressions our model can be easily utilized by both circuit designers and LNA design automation algorithms. Simulations for three LNA topologies at different operating conditions show that the model describes IM components with an error lower than 0.1% and a one order of magnitude faster response time. The model also indicates that for narrowband IM2@w1-w2 all the nonlinear capacitances can be neglected while for narrowband IM3 the nonlinear capacitances at the drainterminal can be neglected.
    Original languageEnglish
    Title of host publicationIEEE Custom Integrated Circuits Conference 2008 (CICC2008)
    Place of PublicationPiscataway
    PublisherIEEE
    Pages221-224
    Number of pages4
    ISBN (Print)978-1-4244-2018-6
    DOIs
    Publication statusPublished - 21 Sep 2008
    EventIEEE Custom Integrated Circuits Conference 2008 - San Jose, United States
    Duration: 21 Sep 200824 Sep 2008

    Publication series

    Name
    PublisherIEEE Computer Society Press
    Number412

    Conference

    ConferenceIEEE Custom Integrated Circuits Conference 2008
    Abbreviated titleCICC 2008
    CountryUnited States
    CitySan Jose
    Period21/09/0824/09/08

    Keywords

    • EWI-14964
    • METIS-255458
    • IR-65345

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  • Cite this

    Cheng, W., Annema, A. J., Croon, J. A., Nauta, B., & Klaassen, D. B. M. (2008). A general weak nonlinearity model for LNAs. In IEEE Custom Integrated Circuits Conference 2008 (CICC2008) (pp. 221-224). [10.1109/CICC.2008.4672063] Piscataway: IEEE. https://doi.org/10.1109/CICC.2008.4672063