A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes

Remco Stoffer; Manfred Hammer; Alyona Ivanova; Hugo Hoekstra

A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes

Remco Stoffer, Manfred Hammer, Alyona Ivanova, Hugo Hoekstra

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

35 Downloads (Pure)

Abstract

Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.

Original language	English
Title of host publication	18th International Workshop on Optical Waveguide Theory and Numerical Modelling
Subtitle of host publication	9th-10th April, 2010, University of Cambridge, William Gates Building
Place of Publication	Nottingham, UK
Publisher	The George Green Institute for Electromagnetics Research
Pages	62-62
Number of pages	1
ISBN (Print)	978-0-9541146-2-6
Publication status	Published - Apr 2010
Event	19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010 - Cambridge, United Kingdom Duration: 9 Apr 2010 → 10 Apr 2010 Conference number: 19 https://www.owtnm-workshop.org/

Workshop

Workshop	19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010
Abbreviated title	OWTNM
Country/Territory	United Kingdom
City	Cambridge
Period	9/04/10 → 10/04/10
Internet address	https://www.owtnm-workshop.org/

Access to Document

Stoffer2010guidedFinal published version, 444 KB

Cite this

Stoffer, R., Hammer, M., Ivanova, A., & Hoekstra, H. (2010). A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. In 18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building (pp. 62-62). The George Green Institute for Electromagnetics Research.

Stoffer, Remco ; Hammer, Manfred ; Ivanova, Alyona et al. / A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. 18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building. Nottingham, UK : The George Green Institute for Electromagnetics Research, 2010. pp. 62-62

@inproceedings{b09ac221fbba4799abaef29d7d81f89c,

title = "A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes",

abstract = "Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.",

author = "Remco Stoffer and Manfred Hammer and Alyona Ivanova and Hugo Hoekstra",

year = "2010",

month = apr,

language = "English",

isbn = "978-0-9541146-2-6",

pages = "62--62",

booktitle = "18th International Workshop on Optical Waveguide Theory and Numerical Modelling",

publisher = "The George Green Institute for Electromagnetics Research",

note = "19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010, OWTNM ; Conference date: 09-04-2010 Through 10-04-2010",

url = "https://www.owtnm-workshop.org/",

}

Stoffer, R, Hammer, M, Ivanova, A & Hoekstra, H 2010, A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. in 18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building. The George Green Institute for Electromagnetics Research, Nottingham, UK, pp. 62-62, 19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010, Cambridge, United Kingdom, 9/04/10.

A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. / Stoffer, Remco; Hammer, Manfred; Ivanova, Alyona et al.
18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building. Nottingham, UK: The George Green Institute for Electromagnetics Research, 2010. p. 62-62.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes

AU - Stoffer, Remco

AU - Hammer, Manfred

AU - Ivanova, Alyona

AU - Hoekstra, Hugo

N1 - Conference code: 19

PY - 2010/4

Y1 - 2010/4

N2 - Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.

AB - Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.

M3 - Conference contribution

SN - 978-0-9541146-2-6

SP - 62

EP - 62

BT - 18th International Workshop on Optical Waveguide Theory and Numerical Modelling

PB - The George Green Institute for Electromagnetics Research

CY - Nottingham, UK

T2 - 19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010

Y2 - 9 April 2010 through 10 April 2010

ER -

Stoffer R, Hammer M, Ivanova A, Hoekstra H. A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. In 18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building. Nottingham, UK: The George Green Institute for Electromagnetics Research. 2010. p. 62-62