A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes

Remco Stoffer, Manfred Hammer, Alyona Ivanova, Hugo Hoekstra

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    Abstract

    Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.
    Original languageEnglish
    Title of host publication18th International Workshop on Optical Waveguide Theory and Numerical Modelling
    Subtitle of host publication9th-10th April, 2010, University of Cambridge, William Gates Building
    Place of PublicationNottingham, UK
    PublisherThe George Green Institute for Electromagnetics Research
    Pages62-62
    Number of pages1
    ISBN (Print)978-0-9541146-2-6
    Publication statusPublished - Apr 2010
    Event19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010 - Cambridge, United Kingdom
    Duration: 9 Apr 201010 Apr 2010
    Conference number: 19
    https://www.owtnm-workshop.org/

    Workshop

    Workshop19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010
    Abbreviated titleOWTNM
    CountryUnited Kingdom
    CityCambridge
    Period9/04/1010/04/10
    Internet address

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