A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes

Remco Stoffer, Manfred Hammer, Alyona Ivanova, Hugo Hoekstra

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    Abstract

    Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.
    Original languageEnglish
    Title of host publication18th International Workshop on Optical Waveguide Theory and Numerical Modelling
    Subtitle of host publication9th-10th April, 2010, University of Cambridge, William Gates Building
    Place of PublicationNottingham, UK
    PublisherThe George Green Institute for Electromagnetics Research
    Pages62-62
    Number of pages1
    ISBN (Print)978-0-9541146-2-6
    Publication statusPublished - Apr 2010
    Event19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010 - Cambridge, United Kingdom
    Duration: 9 Apr 201010 Apr 2010
    Conference number: 19
    https://www.owtnm-workshop.org/

    Workshop

    Workshop19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010
    Abbreviated titleOWTNM
    CountryUnited Kingdom
    CityCambridge
    Period9/04/1010/04/10
    Internet address

    Fingerprint

    slits
    near fields
    microscopy
    waveguides
    scanning
    probes
    magnetic fields
    metals

    Cite this

    Stoffer, R., Hammer, M., Ivanova, A., & Hoekstra, H. (2010). A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. In 18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building (pp. 62-62). Nottingham, UK: The George Green Institute for Electromagnetics Research.
    Stoffer, Remco ; Hammer, Manfred ; Ivanova, Alyona ; Hoekstra, Hugo. / A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. 18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building. Nottingham, UK : The George Green Institute for Electromagnetics Research, 2010. pp. 62-62
    @inproceedings{b09ac221fbba4799abaef29d7d81f89c,
    title = "A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes",
    abstract = "Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.",
    author = "Remco Stoffer and Manfred Hammer and Alyona Ivanova and Hugo Hoekstra",
    year = "2010",
    month = "4",
    language = "English",
    isbn = "978-0-9541146-2-6",
    pages = "62--62",
    booktitle = "18th International Workshop on Optical Waveguide Theory and Numerical Modelling",
    publisher = "The George Green Institute for Electromagnetics Research",

    }

    Stoffer, R, Hammer, M, Ivanova, A & Hoekstra, H 2010, A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. in 18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building. The George Green Institute for Electromagnetics Research, Nottingham, UK, pp. 62-62, 19th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010, Cambridge, United Kingdom, 9/04/10.

    A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. / Stoffer, Remco; Hammer, Manfred; Ivanova, Alyona; Hoekstra, Hugo.

    18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building. Nottingham, UK : The George Green Institute for Electromagnetics Research, 2010. p. 62-62.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes

    AU - Stoffer, Remco

    AU - Hammer, Manfred

    AU - Ivanova, Alyona

    AU - Hoekstra, Hugo

    PY - 2010/4

    Y1 - 2010/4

    N2 - Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.

    AB - Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.

    M3 - Conference contribution

    SN - 978-0-9541146-2-6

    SP - 62

    EP - 62

    BT - 18th International Workshop on Optical Waveguide Theory and Numerical Modelling

    PB - The George Green Institute for Electromagnetics Research

    CY - Nottingham, UK

    ER -

    Stoffer R, Hammer M, Ivanova A, Hoekstra H. A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. In 18th International Workshop on Optical Waveguide Theory and Numerical Modelling: 9th-10th April, 2010, University of Cambridge, William Gates Building. Nottingham, UK: The George Green Institute for Electromagnetics Research. 2010. p. 62-62