A hierarchical approach to test generation for CMOS VLSI circuits

E.C. Weening

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Wallinga, Hans, Supervisor
    • Kerkhoff, Hans Gerard, Advisor
    Award date30 Oct 1992
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-9005449-9
    Publication statusPublished - 30 Oct 1992

    Keywords

    • METIS-111471

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