A hierarchical approach to test-pattern generation

E.C. Weening, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. of the 2nd European Test Conference
    Place of PublicationMunich
    Pages518-
    Number of pages0
    Publication statusPublished - 10 Apr 1991

    Keywords

    • METIS-112966

    Cite this

    Weening, E. C., & Kerkhoff, H. G. (1991). A hierarchical approach to test-pattern generation. In Proc. of the 2nd European Test Conference (pp. 518-). Munich.
    Weening, E.C. ; Kerkhoff, Hans G. / A hierarchical approach to test-pattern generation. Proc. of the 2nd European Test Conference. Munich, 1991. pp. 518-
    @inproceedings{16154914006e44458f88b294beb1acc9,
    title = "A hierarchical approach to test-pattern generation",
    keywords = "METIS-112966",
    author = "E.C. Weening and Kerkhoff, {Hans G.}",
    year = "1991",
    month = "4",
    day = "10",
    language = "Undefined",
    pages = "518--",
    booktitle = "Proc. of the 2nd European Test Conference",

    }

    Weening, EC & Kerkhoff, HG 1991, A hierarchical approach to test-pattern generation. in Proc. of the 2nd European Test Conference. Munich, pp. 518-.

    A hierarchical approach to test-pattern generation. / Weening, E.C.; Kerkhoff, Hans G.

    Proc. of the 2nd European Test Conference. Munich, 1991. p. 518-.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - A hierarchical approach to test-pattern generation

    AU - Weening, E.C.

    AU - Kerkhoff, Hans G.

    PY - 1991/4/10

    Y1 - 1991/4/10

    KW - METIS-112966

    M3 - Conference contribution

    SP - 518-

    BT - Proc. of the 2nd European Test Conference

    CY - Munich

    ER -

    Weening EC, Kerkhoff HG. A hierarchical approach to test-pattern generation. In Proc. of the 2nd European Test Conference. Munich. 1991. p. 518-