A hierarchical approach to test-pattern generation

E.C. Weening, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Original languageUndefined
    Title of host publicationProc. of the 2nd European Test Conference
    Place of PublicationMunich
    Pages518-
    Number of pages0
    Publication statusPublished - 10 Apr 1991

    Keywords

    • METIS-112966

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