A hierarchical approach to test-pattern generation

E.C. Weening, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. of the 2nd European Test Conference
    Place of PublicationMunich
    Pages518-
    Number of pages0
    Publication statusPublished - 10 Apr 1991

    Keywords

    • METIS-112966

    Cite this

    Weening, E. C., & Kerkhoff, H. G. (1991). A hierarchical approach to test-pattern generation. In Proc. of the 2nd European Test Conference (pp. 518-). Munich.