A Labview/Arduino Measurement System for Shape Memory Alloy Wires

Joran Bart Driesen; Clécio Fischer; Guilherme Luiz  Caselato de Sousa; Osmar de Sousa Santos; Richard  Loendersloot; Domingos Alvas Rade; Cristiane Aparecida Martins; Luiz Carlos Sandoval Góes

doi:10.1109/INDUSCON.2018.8627164

A Labview/Arduino Measurement System for Shape Memory Alloy Wires

Joran Bart Driesen, Clécio Fischer, Guilherme Luiz Caselato de Sousa, Osmar de Sousa Santos, Richard Loendersloot, Domingos Alvas Rade, Cristiane Aparecida Martins, Luiz Carlos Sandoval Góes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

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Abstract

Shape memory alloy (SMA) wires have extensive use in many areas of the industry nowadays and its development continues reaching new applications as studies progress. This paper proposes a SMA measurement device that uses affordable components, such as the Arduino micro-controller and a LabVIEW programming language interface. With an antagonistic mechanism design, data on temperature, strain and stress is acquired to confirm the measuring capabilities of the full equipped instrument, rendering visualizations of phase transformations and opening way for further development in control and detailed acquisition of shape memory alloy wire properties.

Original language	English
Title of host publication	2018 13th IEEE International Conference on Industry Applications (INDUSCON)
Publisher	IEEE
Pages	1179-1186
ISBN (Electronic)	978-1-5386-7995-1
ISBN (Print)	978-1-5386-7996-8
DOIs	https://doi.org/10.1109/INDUSCON.2018.8627164
Publication status	Published - 12 Nov 2018
Event	13th IEEE/IAS International Conference on Industry Applications 2018 - Sao Paulo, Brazil Duration: 12 Nov 2018 → 14 Nov 2018 Conference number: 13

Conference

Conference	13th IEEE/IAS International Conference on Industry Applications 2018
Abbreviated title	Induscon 2018
Country/Territory	Brazil
City	Sao Paulo
Period	12/11/18 → 14/11/18

Keywords

Electrical machines
Electrical drives
automation
process control
shape memory alloy
LabVIEW
Arduino

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10.1109/INDUSCON.2018.8627164

Cite this

@inproceedings{71758d61645240cfb04f6bd470616cca,

title = "A Labview/Arduino Measurement System for Shape Memory Alloy Wires",

abstract = "Shape memory alloy (SMA) wires have extensive use in many areas of the industry nowadays and its development continues reaching new applications as studies progress. This paper proposes a SMA measurement device that uses affordable components, such as the Arduino micro-controller and a LabVIEW programming language interface. With an antagonistic mechanism design, data on temperature, strain and stress is acquired to confirm the measuring capabilities of the full equipped instrument, rendering visualizations of phase transformations and opening way for further development in control and detailed acquisition of shape memory alloy wire properties.",

keywords = "Electrical machines, Electrical drives, automation, process control, shape memory alloy, LabVIEW, Arduino",

author = "Driesen, {Joran Bart} and Cl{\'e}cio Fischer and {Caselato de Sousa}, {Guilherme Luiz} and {de Sousa Santos}, Osmar and Richard Loendersloot and Rade, {Domingos Alvas} and Martins, {Cristiane Aparecida} and G{\'o}es, {Luiz Carlos Sandoval}",

note = "To be added to UT-WB 17/98 Technische Mechanica and 201-6B Dynamics Based Maintenance - should be possible through {"}projects{"} (under relations), but this is not possible to an unknown technical issue that is mentioned, yet not dealt with.; 13th IEEE/IAS International Conference on Industry Applications 2018, Induscon 2018 ; Conference date: 12-11-2018 Through 14-11-2018",

year = "2018",

month = nov,

day = "12",

doi = "10.1109/INDUSCON.2018.8627164",

language = "English",

isbn = "978-1-5386-7996-8",

pages = "1179--1186",

booktitle = "2018 13th IEEE International Conference on Industry Applications (INDUSCON)",

publisher = "IEEE",

address = "United States",

}

Driesen, JB, Fischer, C, Caselato de Sousa, GL, de Sousa Santos, O, Loendersloot, R, Rade, DA, Martins, CA & Góes, LCS 2018, A Labview/Arduino Measurement System for Shape Memory Alloy Wires. in 2018 13th IEEE International Conference on Industry Applications (INDUSCON). IEEE, pp. 1179-1186, 13th IEEE/IAS International Conference on Industry Applications 2018, Sao Paulo, Brazil, 12/11/18. https://doi.org/10.1109/INDUSCON.2018.8627164

A Labview/Arduino Measurement System for Shape Memory Alloy Wires. / Driesen, Joran Bart; Fischer, Clécio; Caselato de Sousa, Guilherme Luiz et al.
2018 13th IEEE International Conference on Industry Applications (INDUSCON). IEEE, 2018. p. 1179-1186.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - A Labview/Arduino Measurement System for Shape Memory Alloy Wires

AU - Driesen, Joran Bart

AU - Fischer, Clécio

AU - Caselato de Sousa, Guilherme Luiz

AU - de Sousa Santos, Osmar

AU - Loendersloot, Richard

AU - Rade, Domingos Alvas

AU - Martins, Cristiane Aparecida

AU - Góes, Luiz Carlos Sandoval

N1 - Conference code: 13

PY - 2018/11/12

Y1 - 2018/11/12

N2 - Shape memory alloy (SMA) wires have extensive use in many areas of the industry nowadays and its development continues reaching new applications as studies progress. This paper proposes a SMA measurement device that uses affordable components, such as the Arduino micro-controller and a LabVIEW programming language interface. With an antagonistic mechanism design, data on temperature, strain and stress is acquired to confirm the measuring capabilities of the full equipped instrument, rendering visualizations of phase transformations and opening way for further development in control and detailed acquisition of shape memory alloy wire properties.

AB - Shape memory alloy (SMA) wires have extensive use in many areas of the industry nowadays and its development continues reaching new applications as studies progress. This paper proposes a SMA measurement device that uses affordable components, such as the Arduino micro-controller and a LabVIEW programming language interface. With an antagonistic mechanism design, data on temperature, strain and stress is acquired to confirm the measuring capabilities of the full equipped instrument, rendering visualizations of phase transformations and opening way for further development in control and detailed acquisition of shape memory alloy wire properties.

KW - Electrical machines

KW - Electrical drives

KW - automation

KW - process control

KW - shape memory alloy

KW - LabVIEW

KW - Arduino

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M3 - Conference contribution

SN - 978-1-5386-7996-8

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BT - 2018 13th IEEE International Conference on Industry Applications (INDUSCON)

PB - IEEE

T2 - 13th IEEE/IAS International Conference on Industry Applications 2018

Y2 - 12 November 2018 through 14 November 2018

ER -

A Labview/Arduino Measurement System for Shape Memory Alloy Wires

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