A method for accuracy of placement analysis on radiolucent polyether-ether-keton facial implants: A case series

M. C.P. Kortman, J. Jansma, R. H. Schepers, C. H. Slump, B. J. Merema, J. Kraeima*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

Facial asymmetry is defined as a bilateral difference between facial components. Correction, often desired by the patient, can be performed with the aim of bone born patient-specific solid implants designed using 3D CAD software. This treatment is embedded in the daily practice of today's healthcare. However, an analysis of the implant's accuracy of placement has not been reported. This case series describes the accuracy analysis of bone born aesthetic facial implants manufactured out of polyether-ether-ketone (PEEK). The accuracy analysis was based on postoperative (cone beam) computed tomography ((CB)CT) data and preoperative 3D planning. The analysis showed a median entry point error of 0.7 mm (min: 0.1, max: 3.3, interquartile range: 0.78). The median maximal orientation error was 5.5° (min: 0.1, max: 36.8, interquartile range: 7.13). Both parameters showed an excellent intraobserver and interobserver agreement with an ICC above 0.84. The described cases show that the analysis method is an objective approach for determining the accuracy of PSI placement and indicates that these implants can be placed accurately on the osseous face.

Original languageEnglish
Pages (from-to)1082-1087
Number of pages6
JournalJournal of Cranio-Maxillofacial Surgery
Volume52
Issue number10
Early online date15 Jun 2024
DOIs
Publication statusPublished - Oct 2024

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