A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

J.C. Lodder, K.G. van den Berg

Research output: Contribution to journal › Article › Academic › peer-review

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Keywords

@article{fc16b100ef464803af87789a3b26e43c,

title = "A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope",

keywords = "SMI-TST: From 2006 in EWI-TST, SMI-EXP: EXPERIMENTAL TECHNIQUES",

author = "J.C. Lodder and {van den Berg}, K.G.",

year = "1973",

doi = "10.1111/j.1365-2818.1974.tb03916.x",

language = "English",

volume = "100",

pages = "93--98",

journal = "Journal of microscopy",

issn = "0022-2720",

publisher = "Wiley-Blackwell",

number = "1",

}

TY - JOUR

T1 - A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

AU - Lodder, J.C.

AU - van den Berg, K.G.

PY - 1973

Y1 - 1973

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-EXP: EXPERIMENTAL TECHNIQUES

U2 - 10.1111/j.1365-2818.1974.tb03916.x

DO - 10.1111/j.1365-2818.1974.tb03916.x

M3 - Article

VL - 100

SP - 93

EP - 98

JO - Journal of microscopy

JF - Journal of microscopy

SN - 0022-2720

IS - 1

ER -