A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

J.C. Lodder, Klaas van den Berg

    Research output: Contribution to journalArticleAcademicpeer-review

    12 Citations (Scopus)
    94 Downloads (Pure)
    Original languageUndefined
    Pages (from-to)93-98
    Number of pages6
    JournalJournal of microscopy
    Volume100
    Publication statusPublished - 1973

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • IR-66121
    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • EWI-5550

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