A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

J.C. Lodder, Klaas van den Berg

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Keywords

@article{fc16b100ef464803af87789a3b26e43c,

title = "A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope",

keywords = "SMI-TST: From 2006 in EWI-TST, IR-66121, SMI-EXP: EXPERIMENTAL TECHNIQUES, EWI-5550",

author = "J.C. Lodder and {van den Berg}, Klaas",

note = "Imported from SMI Reference manager",

year = "1973",

language = "Undefined",

volume = "100",

pages = "93--98",

journal = "Journal of microscopy",

issn = "0022-2720",

publisher = "Wiley-Blackwell",

}

TY - JOUR

T1 - A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

AU - Lodder, J.C.

AU - van den Berg, Klaas

N1 - Imported from SMI Reference manager

PY - 1973

Y1 - 1973

KW - SMI-TST: From 2006 in EWI-TST

KW - IR-66121

KW - SMI-EXP: EXPERIMENTAL TECHNIQUES

KW - EWI-5550

M3 - Article

VL - 100

SP - 93

EP - 98

JO - Journal of microscopy

JF - Journal of microscopy

SN - 0022-2720

ER -