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A Method for Comparing Dry Etch Equipment

  • Andrei Avram
  • , Henk Willem Veltkamp
  • , Marek Elias
  • , Sabina Ronchin
  • , Charles De Boer
  • , Jens Hovik
  • , Meint De Boer

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

309 Downloads (Pure)

Abstract

In this paper, we present a verification method to compare the hardware and etch performance of different Oxford Instruments dry etching systems to facilitate etch recipe transfer. The flow-pressure window and the chemical and physical flux within the same flow-pressure window were determined for each system. The chemical and physical fluxes were matched between the investigated systems to yield similar etch results. The method was tested using a continuous SF6/O2 silicon etching recipe.

Original languageEnglish
Title of host publication2024 16th International Symposium on Electronics and Telecommunications, ISETC 2024 - Conference Proceedings
PublisherIEEE
ISBN (Electronic)9798350390865
DOIs
Publication statusPublished - 2024
Event16th International Symposium on Electronics and Telecommunications, ISETC 2024 - Timisoara, Romania
Duration: 7 Nov 20248 Nov 2024
Conference number: 16

Conference

Conference16th International Symposium on Electronics and Telecommunications, ISETC 2024
Abbreviated titleISETC 2024
Country/TerritoryRomania
CityTimisoara
Period7/11/248/11/24

Keywords

  • 2025 OA procedure
  • Si etching
  • ICP reactive ion etching

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