A Multi-Scale Approach to Directional Field Estimation

A.M. Bazen; N.J. Bouman; Raymond N.J. Veldhuis

A Multi-Scale Approach to Directional Field Estimation

A.M. Bazen, N.J. Bouman, Raymond N.J. Veldhuis

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Abstract

This paper proposes a robust method for directional field estimation from fingerprint images that combines estimates at multiple scales. The method is able to provide accurate estimates in scratchy regions, while at the same time maintaining correct estimates around singular points. Compared to other methods, the penalty for detecting false singular points is much smaller, because this does not deteriorate the directional field estimate.

Original language	Undefined
Title of host publication	Proceedings of the STW program: ProRISC
Place of Publication	Veldhoven, The Netherlands
Publisher	STW/NWO/Dutch Ministry of Economic Affairs
Pages	215-218
Number of pages	4
ISBN (Print)	90-73461-43-X
Publication status	Published - 25 Nov 2004
Event	15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands Duration: 25 Nov 2004 → 26 Nov 2004 Conference number: 15

Publication series

Name
Publisher	STW/NWO/Dutch Ministry of Economic Affairs

Conference

Conference	15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004
Abbreviated title	ProRisc
Country/Territory	Netherlands
City	Veldhoven
Period	25/11/04 → 26/11/04

Keywords

IR-48109
Biometrics
multi-scale analysis
METIS-219303
directional field estimation
Fingerprint recognition

Access to Document

bazen

Cite this

@inproceedings{6bccdd668c174374b531aea12e790a75,

title = "A Multi-Scale Approach to Directional Field Estimation",

abstract = "This paper proposes a robust method for directional field estimation from fingerprint images that combines estimates at multiple scales. The method is able to provide accurate estimates in scratchy regions, while at the same time maintaining correct estimates around singular points. Compared to other methods, the penalty for detecting false singular points is much smaller, because this does not deteriorate the directional field estimate.",

keywords = "IR-48109, Biometrics, multi-scale analysis, METIS-219303, directional field estimation, Fingerprint recognition",

author = "A.M. Bazen and N.J. Bouman and Veldhuis, {Raymond N.J.}",

note = "SAS 36-04 ; 15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 ; Conference date: 25-11-2004 Through 26-11-2004",

year = "2004",

month = nov,

day = "25",

language = "Undefined",

isbn = "90-73461-43-X",

publisher = "STW/NWO/Dutch Ministry of Economic Affairs",

pages = "215--218",

booktitle = "Proceedings of the STW program: ProRISC",

}

TY - GEN

T1 - A Multi-Scale Approach to Directional Field Estimation

AU - Bazen, A.M.

AU - Bouman, N.J.

AU - Veldhuis, Raymond N.J.

N1 - Conference code: 15

PY - 2004/11/25

Y1 - 2004/11/25

N2 - This paper proposes a robust method for directional field estimation from fingerprint images that combines estimates at multiple scales. The method is able to provide accurate estimates in scratchy regions, while at the same time maintaining correct estimates around singular points. Compared to other methods, the penalty for detecting false singular points is much smaller, because this does not deteriorate the directional field estimate.

AB - This paper proposes a robust method for directional field estimation from fingerprint images that combines estimates at multiple scales. The method is able to provide accurate estimates in scratchy regions, while at the same time maintaining correct estimates around singular points. Compared to other methods, the penalty for detecting false singular points is much smaller, because this does not deteriorate the directional field estimate.

KW - IR-48109

KW - Biometrics

KW - multi-scale analysis

KW - METIS-219303

KW - directional field estimation

KW - Fingerprint recognition

M3 - Conference contribution

SN - 90-73461-43-X

SP - 215

EP - 218

BT - Proceedings of the STW program: ProRISC

PB - STW/NWO/Dutch Ministry of Economic Affairs

CY - Veldhoven, The Netherlands

T2 - 15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004

Y2 - 25 November 2004 through 26 November 2004

ER -