A New Analog Fault Simulation Method Based on DC-Bias Grouping

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of IEEE International Mixed-Signal Test Workshop
    Place of PublicationMontpellier - France
    Pages170-174
    Publication statusPublished - 27 Jan 2000

    Keywords

    • METIS-113029

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