A New Analog Fault Simulation Method Based on DC-Bias Grouping

N. Engin, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of IEEE International Mixed-Signal Test Workshop
Place of Publication	Montpellier - France
Pages	170-174
Publication status	Published - 27 Jan 2000

Keywords

@inproceedings{eb2048ba8a6f4184b21aa47d4d7709f1,

title = "A New Analog Fault Simulation Method Based on DC-Bias Grouping",

keywords = "METIS-113029",

author = "N. Engin and Kerkhoff, \{Hans G.\}",

year = "2000",

month = jan,

day = "27",

language = "Undefined",

pages = "170--174",

booktitle = "Proceedings of IEEE International Mixed-Signal Test Workshop",

}